Department of Industrial Engineering2024-11-0920099783-9026-6143-21474-667010.3182/20090603-3-RU-2001.03692-s2.0-79960907970http://dx.doi.org/10.3182/20090603-3-RU-2001.0369https://hdl.handle.net/20.500.14288/9274We analyze the component testing problem of devices which consist of series connection of redundant, standby redundant and k-out-of-n subsystems. Although system reliability is a common performance measure, here we extend previous studies by considering expected system lifetime. This case applies when setting mission time for a system is more practical than deciding on system reliability accurately. The problem is formulated as a semi-infinite linear programming problem, and the optimum test times are obtained with a column generation technique incorporating reverse convex programming. The proposed solution technique is also illustrated by numerical examples.Industrial engineeringConference proceedinghttps://www.scopus.com/inward/record.uri?eid=2-s2.0-79960907970anddoi=10.3182%2f20090603-3-RU-2001.0369andpartnerID=40andmd5=a185648b8557d43fcf8535826bf7b83aN/A6285