Ürey, HakanAygün, Uğur2024-11-092020https://hdl.handle.net/20.500.14288/6035xx, 110 leaves : illustrations ; 30 cm.restrictedAccessOptical reconstruction microscopyScattering microscopyScience and technologyDepth scanning correlation interferometric microscopy for label-free nanoparticle detectionDissertation© All Rights Reserved. Accessible to Koç University Affiliated Users Only!