2024-11-0920129781-4577-1511-22160-503310.1109/OMEMS.2012.63188372-s2.0-84869200565http://dx.doi.org/10.1109/OMEMS.2012.6318837https://hdl.handle.net/20.500.14288/14134MEMS LGI FTIR system is developed and optimized. Out-of-plane deflection >500μm is obtained at 350Hz using piezoelectric and acoustic actuation. Optical system is optimized to obtain the best spectrum. 20μm SOI film thickness is measured.Electrical electronics engineeringMEMS FTIR spectrometer and optical resultsConference proceedinghttps://www.scopus.com/inward/record.uri?eid=2-s2.0-84869200565anddoi=10.1109%2fOMEMS.2012.6318837andpartnerID=40andmd5=17f8033ae16982c034b3245fc8563770309942400061N/A8953