Department of Physics2024-11-1020051041-113510.1109/LPT.2005.8508962-s2.0-23844521594http://dx.doi.org/10.1109/LPT.2005.850896https://hdl.handle.net/20.500.14288/15938We report the observation of morphology-dependent resonances from silicon microspheres. The dropped channels are observed both in the transmission and elastic scattering spectra in the O-band. The filter drops approximately 23% of the power at the resonance wavelength. The highest observed quality factor for the morphology-dependent resonances was on the order of 10(5). These resonances have a linewidth of 0.007 nm and a mode spacing of 0.19 nm.Electrical electronics engineeringOpticsPhysicsJournal Article1941-01742307991000269721