Researcher: Kümeç, Feyzi Ege
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Kümeç, Feyzi Ege
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Publication Metadata only On the reliability analysis of C-V2X Mode 4 for next generation connected vehicle applications(Institute of Electrical and Electronics Engineers (IEEE), 2022) Karaağaç, Sercan; N/A; N/A; N/A; N/A; N/A; Department of Electrical and Electronics Engineering; Reyhanoğlu, Aslıhan; Kar, Emrah; Kümeç, Feyzi Ege; Kara, Yahya Şükür Can; Turan, Buğra; Ergen, Sinem Çöleri; Researcher; Researcher; Researcher; Researcher; PhD Student; Faculty Member; Department of Electrical and Electronics Engineering; N/A; N/A; N/A; N/A; Graduate School of Sciences and Engineering; College of Engineering; N/A; N/A; N/A; N/A; N/A; 7211Vehicle-to-Everything Communication (V2X) technologies are provisioned to play an important role in increasing road safety by enabling advanced connected vehicle applications such as cooperative perception, cooperative driving, and remote driving. However, the reliability of the technology is limited mainly due to wireless communication channel characteristics. Therefore, investigation of V2X reliability aspects is crucial to utilize the technology efficiently. In this paper, we provide simulation and measurement-based reliability analysis of Cellular Vehicle-to-Everything (C-V2X) Mode 4 technology for various message sizes and Modulation and Coding Schemes (MCS) selections. We demonstrate that the Packet Delivery Ratio (PDR), a key communication performance metric, heavily depends on message size and selected MCS.