Publication:
Image-difficulty-aware evaluation of super-resolution models

dc.conference.dateSEP 14–17, 2025
dc.conference.locationAnchorage, AK, USA
dc.contributor.departmentKUIS AI (Koç University & İş Bank Artificial Intelligence Center)
dc.contributor.departmentGraduate School of Sciences and Engineering
dc.contributor.departmentDepartment of Electrical and Electronics Engineering
dc.contributor.kuauthorBilican, Ahmet
dc.contributor.kuauthorKorkmaz, Cansu
dc.contributor.kuauthorTekalp, Ahmet Murat
dc.contributor.kuauthorTopaloğlu, Atakan
dc.contributor.schoolcollegeinstituteCollege of Engineering
dc.contributor.schoolcollegeinstituteGRADUATE SCHOOL OF SCIENCES AND ENGINEERING
dc.contributor.schoolcollegeinstituteResearch Center
dc.date.accessioned2026-08-14T11:24:37Z
dc.date.issued2025
dc.description.abstractImage super-resolution models are commonly evaluated by average scores (over some benchmark test sets), which fail to reflect the performance of these models on images of varying difficulty and that some models generate artifacts on certain difficult images, which is not reflected by the average scores. We propose difficultyaware performance evaluation procedures to better differentiate between SISR models that produce visually different results on some images but yield close average performance scores over the entire test set. In particular, we propose two image-difficulty measures, the high-frequency index and rotation-invariant edge index, to predict those test images, where a model would yield significantly better visual results over another model, and an evaluation method where these visual differences are reflected on objective measures. Experimental results demonstrate the effectiveness of the proposed imagedifficulty measures and evaluation methodology.
dc.description.harvestedfromManual
dc.description.indexedbyWOS
dc.description.indexedbyScopus
dc.description.publisherscopeInternational
dc.description.readpublishN/A
dc.description.sponsoredbyTubitakEuN/A
dc.description.sponsorshipThis work was supported in part by an AI Fellowship to C. Korkmaz provided by the KUIS AI Center. A.M. Tekalp acknowledges support from Turkish Academy of Sciences (TUBA)
dc.description.versionPublished Version
dc.identifier.ScopusPercentileN/A
dc.identifier.ScopusQuartileN/A
dc.identifier.WoSPercentileN/A
dc.identifier.WoSQuartileN/A
dc.identifier.doi10.1109/icipw68931.2025.11385995
dc.identifier.embargoN/A
dc.identifier.endpage184
dc.identifier.isbn9798331578008
dc.identifier.scopus2-s2.0-105035599192
dc.identifier.startpage179
dc.identifier.urihttp://doi.org/10.1109/icipw68931.2025.11385995
dc.identifier.urihttps://hdl.handle.net/20.500.14288/34477
dc.identifier.wos001746766000032
dc.keywordsArtifacts
dc.keywordsEvaluation
dc.keywordsImage difficulty measures
dc.keywordsImage super-resolution
dc.keywordsOutliers
dc.languageeng
dc.publisherIEEE
dc.relation.affiliationKoç University
dc.relation.collectionKoç University Institutional Repository
dc.relation.ispartof2025 IEEE International Conference on Image Processing Workshops, Icipw
dc.relation.openaccessN/A
dc.rightsN/A
dc.rights.uriN/A
dc.subjectComputer science
dc.subjectComputer vision and pattern recognition
dc.titleImage-difficulty-aware evaluation of super-resolution models
dc.typeConference Proceeding
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