Publication: Image-difficulty-aware evaluation of super-resolution models
| dc.conference.date | SEP 14–17, 2025 | |
| dc.conference.location | Anchorage, AK, USA | |
| dc.contributor.department | KUIS AI (Koç University & İş Bank Artificial Intelligence Center) | |
| dc.contributor.department | Graduate School of Sciences and Engineering | |
| dc.contributor.department | Department of Electrical and Electronics Engineering | |
| dc.contributor.kuauthor | Bilican, Ahmet | |
| dc.contributor.kuauthor | Korkmaz, Cansu | |
| dc.contributor.kuauthor | Tekalp, Ahmet Murat | |
| dc.contributor.kuauthor | Topaloğlu, Atakan | |
| dc.contributor.schoolcollegeinstitute | College of Engineering | |
| dc.contributor.schoolcollegeinstitute | GRADUATE SCHOOL OF SCIENCES AND ENGINEERING | |
| dc.contributor.schoolcollegeinstitute | Research Center | |
| dc.date.accessioned | 2026-08-14T11:24:37Z | |
| dc.date.issued | 2025 | |
| dc.description.abstract | Image super-resolution models are commonly evaluated by average scores (over some benchmark test sets), which fail to reflect the performance of these models on images of varying difficulty and that some models generate artifacts on certain difficult images, which is not reflected by the average scores. We propose difficultyaware performance evaluation procedures to better differentiate between SISR models that produce visually different results on some images but yield close average performance scores over the entire test set. In particular, we propose two image-difficulty measures, the high-frequency index and rotation-invariant edge index, to predict those test images, where a model would yield significantly better visual results over another model, and an evaluation method where these visual differences are reflected on objective measures. Experimental results demonstrate the effectiveness of the proposed imagedifficulty measures and evaluation methodology. | |
| dc.description.harvestedfrom | Manual | |
| dc.description.indexedby | WOS | |
| dc.description.indexedby | Scopus | |
| dc.description.publisherscope | International | |
| dc.description.readpublish | N/A | |
| dc.description.sponsoredbyTubitakEu | N/A | |
| dc.description.sponsorship | This work was supported in part by an AI Fellowship to C. Korkmaz provided by the KUIS AI Center. A.M. Tekalp acknowledges support from Turkish Academy of Sciences (TUBA) | |
| dc.description.version | Published Version | |
| dc.identifier.ScopusPercentile | N/A | |
| dc.identifier.ScopusQuartile | N/A | |
| dc.identifier.WoSPercentile | N/A | |
| dc.identifier.WoSQuartile | N/A | |
| dc.identifier.doi | 10.1109/icipw68931.2025.11385995 | |
| dc.identifier.embargo | N/A | |
| dc.identifier.endpage | 184 | |
| dc.identifier.isbn | 9798331578008 | |
| dc.identifier.scopus | 2-s2.0-105035599192 | |
| dc.identifier.startpage | 179 | |
| dc.identifier.uri | http://doi.org/10.1109/icipw68931.2025.11385995 | |
| dc.identifier.uri | https://hdl.handle.net/20.500.14288/34477 | |
| dc.identifier.wos | 001746766000032 | |
| dc.keywords | Artifacts | |
| dc.keywords | Evaluation | |
| dc.keywords | Image difficulty measures | |
| dc.keywords | Image super-resolution | |
| dc.keywords | Outliers | |
| dc.language | eng | |
| dc.publisher | IEEE | |
| dc.relation.affiliation | Koç University | |
| dc.relation.collection | Koç University Institutional Repository | |
| dc.relation.ispartof | 2025 IEEE International Conference on Image Processing Workshops, Icipw | |
| dc.relation.openaccess | N/A | |
| dc.rights | N/A | |
| dc.rights.uri | N/A | |
| dc.subject | Computer science | |
| dc.subject | Computer vision and pattern recognition | |
| dc.title | Image-difficulty-aware evaluation of super-resolution models | |
| dc.type | Conference Proceeding | |
| dspace.entity.type | Publication | |
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