An new approach to optimum component testing problem incorporating expected system lifetime

Abstract

We analyze the component testing problem of devices which consist of series connection of redundant, standby redundant and k-out-of-n subsystems. Although system reliability is a common performance measure, here we extend previous studies by considering expected system lifetime. This case applies when setting mission time for a system is more practical than deciding on system reliability accurately. The problem is formulated as a semi-infinite linear programming problem, and the optimum test times are obtained with a column generation technique incorporating reverse convex programming. The proposed solution technique is also illustrated by numerical examples.