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Author correction: label-free detection of nanoparticles using depth scanning correlation interferometric microscopy

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dc.contributor.departmentDepartment of Electrical and Electronics Engineering
dc.contributor.kuauthorAygün, Uğur
dc.contributor.kuauthorÜrey, Hakan
dc.contributor.kuprofileFaculty Member
dc.contributor.otherDepartment of Electrical and Electronics Engineering
dc.contributor.researchcenterKoç University Research Center for Translational Medicine (KUTTAM) / Koç Üniversitesi Translasyonel Tıp Araştırma Merkezi (KUTTAM)
dc.contributor.schoolcollegeinstituteCollege of Engineering
dc.contributor.yokidN/A
dc.contributor.yokid8579
dc.date.accessioned2024-11-09T11:48:48Z
dc.date.issued2019
dc.description.fulltextYES
dc.description.indexedbyWoS
dc.description.indexedbyScopus
dc.description.indexedbyPubMed
dc.description.openaccessYES
dc.description.publisherscopeInternational
dc.description.sponsoredbyTubitakEuEU
dc.description.sponsoredbyTubitakEuTÜBİTAK
dc.description.sponsorshipScientific and Technological Research Council of Turkey (TÜBİTAK)
dc.description.sponsorshipEuropean Union’s Horizon 2020 Research and Innovation Programme
dc.description.sponsorshipEuropean Union (European Union)
dc.description.sponsorshipHorizon 2020
dc.description.versionPublisher version
dc.description.volume9
dc.formatpdf
dc.identifier.doi10.1038/s41598-019-53131-3
dc.identifier.embargoNO
dc.identifier.filenameinventorynoIR01667_1
dc.identifier.issn2045-2322
dc.identifier.linkhttps://doi.org/10.1038/s41598-019-53131-3
dc.identifier.quartileQ2
dc.identifier.scopus2-s2.0-85074729412
dc.identifier.urihttps://hdl.handle.net/20.500.14288/622
dc.identifier.wos495377900003
dc.languageEnglish
dc.publisherNature Publishing Group (NPG)
dc.relation.grantno113E643 and 115E260
dc.relation.grantno766466
dc.relation.urihttp://cdm21054.contentdm.oclc.org/cdm/ref/collection/IR/id/8601
dc.sourceScientific Reports
dc.subjectMultidisciplinary sciences
dc.titleAuthor correction: label-free detection of nanoparticles using depth scanning correlation interferometric microscopy
dc.typeOther
dc.type.otherErratum
dspace.entity.typePublication
local.contributor.authoridN/A
local.contributor.authorid0000-0002-2031-7967
local.contributor.kuauthorAygün, Uğur
local.contributor.kuauthorÜrey, Hakan
relation.isOrgUnitOfPublication21598063-a7c5-420d-91ba-0cc9b2db0ea0
relation.isOrgUnitOfPublication.latestForDiscovery21598063-a7c5-420d-91ba-0cc9b2db0ea0

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