Researcher:
Yüce, Emre

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Master Student

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Emre

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Yüce

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Yüce, Emre

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2009 - 200922010 - 20142

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Researcher Of Publications: search.filters.isAuthorOfPublication.1454cc81-6f6e-4339-aef9-9bc040623ecc

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    Optical modulation with silicon microspheres
    (IEEE-Inst Electrical Electronics Engineers Inc, 2009) Gürlü, Oğuzhan; N/A; Department of Physics; Yüce, Emre; Serpengüzel, Ali; Master Student; Faculty Member; Department of Physics; Graduate School of Sciences and Engineering; College of Sciences; 245435; 27855
    In this letter, a silicon microsphere coupled to a silica optical fiber half coupler has been characterized for electrooptical modulation in the L-band at 1.55 mu m. Electrooptical modulation of the transmitted and the 90 degrees elastic scattered signals for both the TE and the TM polarizations of the microsphere resonances has been observed.
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    Silicon microspheres for optical modulation applications
    (SPIE-Soc Photoptical Instrumentation Engineers, 2009) Gürlü, Oǧuzhan; Department of Physics; Department of Physics; Department of Physics; Serpengüzel, Ali; Yüce, Emre; Murib, Mohammed Sharif; Faculty Member; Master Student; Master Student; Department of Physics; College of Sciences; Graduate School of Sciences and Engineering; Graduate School of Sciences and Engineering; 27855; 245435; N/A
    A silicon microsphere coupled to a silica optical fiber half coupler is excited using a diode laser operating at 1.55 μm. The transmitted and the 90o elastically scattered light signals are modulated with an electrical square wave applied to the silicon microsphere.
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    Polarization behavior of elastic scattering from a silicon microsphere coupled to an optical fiber
    (Optical Soc Amer, 2014) Gürlü, Oğuzhan; N/A; N/A; Department of Physics; Murib, Mohammed Sharif; Yüce, Emre; Serpengüzel, Ali; PhD Student; Master Student; Faculty Member; Department of Physics; Graduate School of Sciences and Engineering; Graduate School of Sciences and Engineering; College of Sciences; N/A; 245435; 27855
    The polarization behavior of elastic scattering at 1473 nm is analyzed from a silicon microsphere on an optical fiber half-coupler. The 0.27 nm angular mode spacing of the resonances correlates well with the optical size of the silicon sphere. The spectral linewidths of the resonances are on the order of 10(-3) nm, which corresponds to quality factors on the order of 10(6). The transverse magnetically polarized elastic scattering signal has higher resonance to modulation depth and background ratio than the transverse electrically polarized elastic scattering signal and is suitable for high-resolution optical filtering applications such as optical monitoring and sensing.
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    Dynamical electrical tuning of a silicon microsphere: used for spectral mapping of the optical resonances
    (Optical Soc Amer, 2014) Gurlu, Oguzhan; Thursby, Graham J.; N/A; Department of Physics; Yüce, Emre; Serpengüzel, Ali; Master Student; Faculty Member; Department of Physics; Graduate School of Sciences and Engineering; College of Sciences; 245435; 27855
    In this work, electrical square pulses at various duty cycles are applied to a silicon microsphere resonator in order to continuously tune the refractive index of a silicon microsphere and to map the optical resonance in the time domain. A continuous-wave semiconductor diode laser operating in the L-band is used for the excitation of the silicon microsphere optical resonances. The 90 degrees transverse magnetically polarized elastic scattering signal is used to monitor the silicon microsphere resonances. We show that at a constant input laser wavelength, up to five high-quality-factor optical resonances can be scanned by dynamical electrical tuning of the silicon microsphere cavity.