Researcher:
Örün, Bilal

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Master Student

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Bilal

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Örün

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Örün, Bilal

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2008 - 20092

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    Numerical simulation of nano scanning in intermittent-contact mode afm under Q control
    (Iop Publishing Ltd, 2008) N/A; N/A; N/A; Department of Mechanical Engineering; Varol, Aydın; Günev, İhsan; Örün, Bilal; Başdoğan, Çağatay; Master Student; Master Student; Master Student; Faculty Member; Department of Mechanical Engineering; Graduate School of Sciences and Engineering; Graduate School of Sciences and Engineering; Graduate School of Sciences and Engineering; College of Engineering; N/A; N/A; N/A; 125489
    We investigate nano scanning in tapping mode atomic force microscopy (aFM) under quality (Q) control via numerical simulations performed in SIMULinK. We focus on the simulation of the whole scan process rather than the simulation of cantilever dynamics and the force interactions between the probe tip and the surface alone, As in most of the earlier numerical studies. This enables us to quantify the scan performance under Q control for different scan settings. Using the numerical simulations, we first investigate the effect of the elastic modulus of the sample (relative to the substrate surface) and probe stiffness on the scan results. Our numerical simulations show that scanning in an attractive regime using soft cantilevers with high effective Q factor (Q(eff)) results in a better image quality. We then demonstrate the trade-off in setting Q(eff) of the probe in Q control: low values of Q(eff) cause an increase in tapping forces while higher ones limit the maximum achievable scan speed due to the slow response of the cantilever to the rapid changes in surface profile. Finally, we show that it is possible to achieve higher scan speeds without causing an increase in the tapping forces using adaptive Q control (aQC), in which the Q factor of the probe is changed instantaneously depending on the magnitude of the error signal in oscillation amplitude. the scan performance of aQC is quantitatively compared to that of standard Q control using iso-error curves obtained from numerical simulations first and then the results are validated through scan experiments performed using a physical set-up.
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    PublicationOpen Access
    State feedback control for adjusting the dynamic behavior of a piezoactuated bimorph atomic force microscopy probe
    (American Institute of Physics (AIP) Publishing, 2009) Güvenç, Levent; Department of Mechanical Engineering; Örün, Bilal; Necipoğlu, Serkan; Başdoğan, Çağatay; Master Student; Faculty Member; Department of Mechanical Engineering; College of Engineering; N/A; N/A; 125489
    We adjust the transient dynamics of a piezoactuated bimorph atomic force microscopy (AFM) probe using a state feedback controller. This approach enables us to adjust the quality factor and the resonance frequency of the probe simultaneously. First, we first investigate the effect of feedback gains on dynamic response of the probe and then show that the time constant of the probe can be reduced by reducing its quality factor and/or increasing its resonance frequency to reduce the scan error in tapping mode AFM.