Publication:
Innovative MEMS stage for automated micromechanical testing

dc.contributor.departmentKUYTAM (Koç University Surface Science and Technology Center)
dc.contributor.departmentDepartment of Mechanical Engineering
dc.contributor.departmentn2STAR (Koç University Nanofabrication and Nanocharacterization Center for Scientifc and Technological Advanced Research)
dc.contributor.departmentGraduate School of Sciences and Engineering
dc.contributor.kuauthorAli, Basit
dc.contributor.kuauthorAlaca, Burhanettin Erdem
dc.contributor.kuauthorKarimzadehkhouei, Mehrdad
dc.contributor.kuauthorZarepakzad, Sina
dc.contributor.kuauthorÇoban, Semih Berk
dc.contributor.schoolcollegeinstituteCollege of Engineering
dc.contributor.schoolcollegeinstituteGRADUATE SCHOOL OF SCIENCES AND ENGINEERING
dc.contributor.schoolcollegeinstituteResearch Center
dc.date.accessioned2025-01-19T10:33:38Z
dc.date.issued2023
dc.description.abstractThis study introduces a comprehensive methodology for designing, fabricating, and testing a MEMS stage integrated into a commercial testing device, with a focus on enabling automated testing of multiple samples under in-plane loading conditions. Drawing inspiration from recent innovative MEMS stage designs, a new approach is developed to integrate micromanipulator tips into a commercial micro-mechanical testing machine, allowing for automated one-directional loading of micro-scale samples. To address challenges related to handling and alignment, a co-fabrication technique is employed, enabling the simultaneous fabrication of the micro-sample and MEMS stage within a single process flow. A novel fabrication method utilizing a silicon-on-insulator substrate is utilized. The calibration of testing method is conducted using both analytical and experimental methods to ensure accurate measurement of force and deflection within the in-plane testing protocol. The released micro-beam structures undergo repetitive loading to evaluate bending deformation. The developed approach is extended to multiple testing attempts on MEMS stage-micro-sample, combinations co-fabricated within a single chip, enabling precise statistical treatment of the measurements. © 2023 IEEE.
dc.description.indexedbyScopus
dc.description.publisherscopeInternational
dc.description.sponsoredbyTubitakEuN/A
dc.identifier.doi10.1109/MARSS58567.2023.10294157
dc.identifier.isbn979-835033039-7
dc.identifier.quartileN/A
dc.identifier.scopus2-s2.0-85177482183
dc.identifier.urihttps://doi.org/10.1109/MARSS58567.2023.10294157
dc.identifier.urihttps://hdl.handle.net/20.500.14288/26642
dc.keywordsAutomation
dc.keywordsFabrication
dc.keywordsMechanical testing
dc.keywordsMEMS
dc.keywordsSilicon on insulator technology
dc.keywordsSilicon wafers
dc.language.isoeng
dc.publisherInstitute of Electrical and Electronics Engineers Inc.
dc.relation.ispartofProceedings of MARSS 2023 - 6th International Conference on Manipulation, Automation, and Robotics at Small Scales
dc.subjectMechanical engineering
dc.titleInnovative MEMS stage for automated micromechanical testing
dc.typeConference Proceeding
dspace.entity.typePublication
local.contributor.kuauthorKarimzadehkhouei, Mehrdad
local.contributor.kuauthorAli, Basit
local.contributor.kuauthorZare Pakzad, Sina
local.contributor.kuauthorAlaca, Burhanettin Erdem
local.contributor.kuauthorÇoban, Semih Berk
local.publication.orgunit1GRADUATE SCHOOL OF SCIENCES AND ENGINEERING
local.publication.orgunit1College of Engineering
local.publication.orgunit1Research Center
local.publication.orgunit2Department of Mechanical Engineering
local.publication.orgunit2KUYTAM (Koç University Surface Science and Technology Center)
local.publication.orgunit2n2STAR (Koç University Nanofabrication and Nanocharacterization Center for Scientifc and Technological Advanced Research)
local.publication.orgunit2Graduate School of Sciences and Engineering
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