Publication: Inverse engineering of optical constants in photochromic micron-scale hybrid films
Program
KU-Authors
KU Authors
Co-Authors
Danis, B. S.
Mohseni, A. T.
Karazhanov, S.
Zayim, E.
Editor & Affiliation
Compiler & Affiliation
Translator
Other Contributor
Date
Language
eng
Type
Embargo Status
N/A
Journal Title
Journal ISSN
Volume Title
Alternative Title
Abstract
Photochromic materials enable dynamic optical modulation through reversible transitions between distinct absorption states, with broad potential for smart windows, adaptive optics, and reconfigurable photonic devices. Micron-scale photochromic hybrid films present a particularly attractive platform for these applications, combining straightforward preparation with substantial optical modulation and scalability for high-volume fabrication. However, rational design of such films remains fundamentally constrained by the absence of well-defined optical constants. Unlike homogeneous thin films, micron-scale hybrid photochromic materials comprise active particles dispersed nonuniformly within polymer matrices. Conventional first-principles electromagnetic simulations face substantial computational costs and discrepancies between simulated and experimental particle distributions. Here, we introduce a data-driven framework that extracts effective optical constants directly from minimal experimental transmittance measurements. Our dual-state effective model approximates the complex inhomogeneous photochromic layer as a compressed homogeneous medium characterized by pseudorefractive indices and pseudoextinction coefficients for both pristine and UV-irradiated states. Through systematic optimization against experimental data from tungsten oxide-polyvinylpyrrolidone hybrid films, we determine wavelength-dependent pseudooptical constants and compression ratios that enable accurate prediction of optical modulation within the tested thickness range. Our methodology establishes a framework for engineering hybrid photochromic systems and demonstrates how data-driven modeling can overcome limitations in characterizing complex nanostructured materials.
Source
Publisher
American Physical Society
Subject
Physics, fluids and plasmas, Physics, mathematical
Citation
Has Part
Source
Physical Review E
Book Series Title
Edition
DOI
10.1103/kmw2-2tx1
