Publication: Flip-KLJN: randomized resistance flipping for noise-driven secure communication
| dc.contributor.coauthor | Yildirim, Ibrahim | |
| dc.contributor.department | Graduate School of Sciences and Engineering | |
| dc.contributor.department | Department of Electrical and Electronics Engineering | |
| dc.contributor.kuauthor | Taşçı, Recep Akif | |
| dc.contributor.kuauthor | Başar, Ertuğrul | |
| dc.contributor.schoolcollegeinstitute | GRADUATE SCHOOL OF SCIENCES AND ENGINEERING | |
| dc.contributor.schoolcollegeinstitute | College of Engineering | |
| dc.date.accessioned | 2025-12-31T08:21:34Z | |
| dc.date.available | 2025-12-31 | |
| dc.date.issued | 2025 | |
| dc.description.abstract | The information-theoretically (unconditionally) secure Kirchhoff-law-Johnson-noise (KLJN) bit exchange protocol uses two identical resistor pairs with high (H) and low (L) resistance values, driven by Gaussian noise generators emulating Johnson noise with a high common temperature. The resulting mean-square noise voltage on the wire connecting Alice and Bob has three levels: low ( L/L ), intermediate ( H/L or L/H ), and high ( H/H ), and secure key sharing is achieved at the intermediate level ( L/H or H/L ). This paper introduces the Flip-KLJN scheme, where a pre-agreed intermediate level, such as H/L , triggers a flip of the bit map value during the bit exchange period. For Eve, the bit map flips appear random. Thus, the formerly discarded H/H and L/L situations can also have a pre-agreed bit value mapping, which flips together with the original bit mapping. Thus, Flip-KLJN doubles the key rate and ensures that all three levels on the wire are indistinguishable for Eve. Bit error probabilities are addressed through analytic calculations and computer simulations. | |
| dc.description.fulltext | No | |
| dc.description.harvestedfrom | Manual | |
| dc.description.indexedby | WOS | |
| dc.description.indexedby | Scopus | |
| dc.description.openaccess | hybrid | |
| dc.description.peerreviewstatus | N/A | |
| dc.description.publisherscope | International | |
| dc.description.readpublish | N/A | |
| dc.description.sponsoredbyTubitakEu | TÜBİTAK | |
| dc.description.sponsorship | TUBITAK [124E146] | |
| dc.description.version | N/A | |
| dc.identifier.doi | 10.1109/TCOMM.2025.3585508 | |
| dc.identifier.eissn | 1558-0857 | |
| dc.identifier.embargo | No | |
| dc.identifier.endpage | 12636 | |
| dc.identifier.filenameinventoryno | IR06711 | |
| dc.identifier.issn | 0090-6778 | |
| dc.identifier.issue | 11 | |
| dc.identifier.quartile | Q1 | |
| dc.identifier.scopus | 2-s2.0-105009948510 | |
| dc.identifier.startpage | 12625 | |
| dc.identifier.uri | https://doi.org/10.1109/TCOMM.2025.3585508 | |
| dc.identifier.uri | https://hdl.handle.net/20.500.14288/31585 | |
| dc.identifier.volume | 73 | |
| dc.identifier.wos | 001616587100024 | |
| dc.keywords | Resistors | |
| dc.keywords | Noise | |
| dc.keywords | Detectors | |
| dc.keywords | Security | |
| dc.keywords | Noise level | |
| dc.keywords | Voltage measurement | |
| dc.keywords | Wire | |
| dc.keywords | Thermal noise | |
| dc.keywords | Current measurement | |
| dc.keywords | Error probability | |
| dc.keywords | Thermal noise communication (TherCom) | |
| dc.keywords | Kirchhoff-law-Johnson-noise (KLJN) | |
| dc.keywords | Bit error probability (BER) | |
| dc.keywords | Key expansion | |
| dc.keywords | Unconditionally secure | |
| dc.language.iso | eng | |
| dc.publisher | Institute of Electrical and Electronics Engineers (IEEE) | |
| dc.relation.affiliation | Koç University | |
| dc.relation.collection | Koç University Institutional Repository | |
| dc.relation.ispartof | IEEE Transactions on Communications | |
| dc.relation.openaccess | No | |
| dc.rights | Copyrighted | |
| dc.subject | Engineering | |
| dc.subject | Telecommunications | |
| dc.title | Flip-KLJN: randomized resistance flipping for noise-driven secure communication | |
| dc.type | Journal Article | |
| dspace.entity.type | Publication | |
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