Publication:
Flip-KLJN: randomized resistance flipping for noise-driven secure communication

dc.contributor.coauthorYildirim, Ibrahim
dc.contributor.departmentGraduate School of Sciences and Engineering
dc.contributor.departmentDepartment of Electrical and Electronics Engineering
dc.contributor.kuauthorTaşçı, Recep Akif
dc.contributor.kuauthorBaşar, Ertuğrul
dc.contributor.schoolcollegeinstituteGRADUATE SCHOOL OF SCIENCES AND ENGINEERING
dc.contributor.schoolcollegeinstituteCollege of Engineering
dc.date.accessioned2025-12-31T08:21:34Z
dc.date.available2025-12-31
dc.date.issued2025
dc.description.abstractThe information-theoretically (unconditionally) secure Kirchhoff-law-Johnson-noise (KLJN) bit exchange protocol uses two identical resistor pairs with high (H) and low (L) resistance values, driven by Gaussian noise generators emulating Johnson noise with a high common temperature. The resulting mean-square noise voltage on the wire connecting Alice and Bob has three levels: low ( L/L ), intermediate ( H/L or L/H ), and high ( H/H ), and secure key sharing is achieved at the intermediate level ( L/H or H/L ). This paper introduces the Flip-KLJN scheme, where a pre-agreed intermediate level, such as H/L , triggers a flip of the bit map value during the bit exchange period. For Eve, the bit map flips appear random. Thus, the formerly discarded H/H and L/L situations can also have a pre-agreed bit value mapping, which flips together with the original bit mapping. Thus, Flip-KLJN doubles the key rate and ensures that all three levels on the wire are indistinguishable for Eve. Bit error probabilities are addressed through analytic calculations and computer simulations.
dc.description.fulltextNo
dc.description.harvestedfromManual
dc.description.indexedbyWOS
dc.description.indexedbyScopus
dc.description.openaccesshybrid
dc.description.peerreviewstatusN/A
dc.description.publisherscopeInternational
dc.description.readpublishN/A
dc.description.sponsoredbyTubitakEuTÜBİTAK
dc.description.sponsorshipTUBITAK [124E146]
dc.description.versionN/A
dc.identifier.doi10.1109/TCOMM.2025.3585508
dc.identifier.eissn1558-0857
dc.identifier.embargoNo
dc.identifier.endpage12636
dc.identifier.filenameinventorynoIR06711
dc.identifier.issn0090-6778
dc.identifier.issue11
dc.identifier.quartileQ1
dc.identifier.scopus2-s2.0-105009948510
dc.identifier.startpage12625
dc.identifier.urihttps://doi.org/10.1109/TCOMM.2025.3585508
dc.identifier.urihttps://hdl.handle.net/20.500.14288/31585
dc.identifier.volume73
dc.identifier.wos001616587100024
dc.keywordsResistors
dc.keywordsNoise
dc.keywordsDetectors
dc.keywordsSecurity
dc.keywordsNoise level
dc.keywordsVoltage measurement
dc.keywordsWire
dc.keywordsThermal noise
dc.keywordsCurrent measurement
dc.keywordsError probability
dc.keywordsThermal noise communication (TherCom)
dc.keywordsKirchhoff-law-Johnson-noise (KLJN)
dc.keywordsBit error probability (BER)
dc.keywordsKey expansion
dc.keywordsUnconditionally secure
dc.language.isoeng
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)
dc.relation.affiliationKoç University
dc.relation.collectionKoç University Institutional Repository
dc.relation.ispartofIEEE Transactions on Communications
dc.relation.openaccessNo
dc.rightsCopyrighted
dc.subjectEngineering
dc.subjectTelecommunications
dc.titleFlip-KLJN: randomized resistance flipping for noise-driven secure communication
dc.typeJournal Article
dspace.entity.typePublication
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