Publication:
Discrete complex image method with spatial error criterion and automatic order selection

dc.contributor.departmentDepartment of Electrical and Electronics Engineering
dc.contributor.departmentN/A
dc.contributor.departmentDepartment of Electrical and Electronics Engineering
dc.contributor.departmentDepartment of Electrical and Electronics Engineering
dc.contributor.kuauthorErdoğan, Alper Tunga
dc.contributor.kuauthorKarabulut, Emine Pınar
dc.contributor.kuauthorAksun, M. İrşadi
dc.contributor.kuprofileFaculty Member
dc.contributor.kuprofilePhD Student
dc.contributor.kuprofileFaculty Member
dc.contributor.schoolcollegeinstituteCollege of Engineering
dc.contributor.schoolcollegeinstituteGraduate School of Sciences and Engineering
dc.contributor.schoolcollegeinstituteCollege of Engineering
dc.contributor.yokid41624
dc.contributor.yokidN/A
dc.contributor.yokid28358
dc.date.accessioned2024-11-09T23:28:38Z
dc.date.issued2011
dc.description.abstractTwo shortcomings of the otherwise very efficient and hence very popular DCIM approach are remedied in this study. First shortcoming is the lack of an error metric that transforms the spatial-domain error to the spectral domain. In standard DCIM procedures, OLS error minimization in the spectral domain does not correspond to the error minimization in the spatial domain. We propose an error criterion by defining an error metric in the spatial domain and mapping it to the spectral domain. Second, by using the proposed spatial error criterion we propose an automatic order selection procedure to find the number of exponentials that describes the Green's function optimally by employing MDL principle to DCIM. The resulting DCIM algorithm is implemented on three-level DCIM and tested on a typical geometry for validation. © 2011 IEEE.
dc.description.indexedbyScopus
dc.description.indexedbyWoS
dc.description.openaccessYES
dc.description.publisherscopeInternational
dc.description.sponsorshipThe Institute of Electrical and Electronics Engineers
dc.description.sponsorshipIEEE Antennas and Propagaion Society
dc.identifier.doi10.1109/APS.2011.5996601
dc.identifier.isbn9781-4244-9563-4
dc.identifier.issn1522-3965
dc.identifier.linkhttps://www.scopus.com/inward/record.uri?eid=2-s2.0-80054965715anddoi=10.1109%2fAPS.2011.5996601andpartnerID=40andmd5=4ed4cbd39157c59af2344069c64867d9
dc.identifier.quartileN/A
dc.identifier.scopus2-s2.0-80054965715
dc.identifier.urihttp://dx.doi.org/10.1109/APS.2011.5996601
dc.identifier.urihttps://hdl.handle.net/20.500.14288/11927
dc.identifier.wos297298501184
dc.keywordsDiscrete complex image method
dc.keywordsError criterion
dc.keywordsError metrices
dc.keywordsError minimization
dc.keywordsExponentials
dc.keywordsMDL principle
dc.keywordsOrder selection
dc.keywordsSpatial domains
dc.keywordsSpatial errors
dc.keywordsSpatial-domain errors
dc.keywordsSpectral domains
dc.keywordsThree-level
dc.keywordsAntennas
dc.keywordsGreen's function
dc.keywordsStrain measurement
dc.keywordsPhotomapping
dc.languageEnglish
dc.publisherIEEE
dc.sourceIEEE Antennas and Propagation Society, AP-S International Symposium (Digest)
dc.subjectEngineering
dc.subjectElectrical electronics engineering
dc.titleDiscrete complex image method with spatial error criterion and automatic order selection
dc.typeConference proceeding
dspace.entity.typePublication
local.contributor.authorid0000-0003-0876-2897
local.contributor.authoridN/A
local.contributor.authorid0000-0003-0338-3476
local.contributor.kuauthorErdoğan, Alper Tunga
local.contributor.kuauthorKarabulut, Emine Pınar
local.contributor.kuauthorAksun, M. İrşadi
relation.isOrgUnitOfPublication21598063-a7c5-420d-91ba-0cc9b2db0ea0
relation.isOrgUnitOfPublication.latestForDiscovery21598063-a7c5-420d-91ba-0cc9b2db0ea0

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