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Silicon microspheres for near-IR communication applications

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Demir, Abdullah

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We have performed transverse electric and transverse magnetic polarized elastic light scattering calculations at 90 degrees and 0 degrees in the o-band at 1.3 mu m for a 15 mu m radius silicon microsphere with a refractive index of 3.5. The quality factors are on the order of 10(7) and the mode/channel spacing is 7 nm, which correlate well with the refractive index and the optical size of the microsphere. The 90 degrees elastic light scattering can be used to monitor a dropped channel (drop port), whereas the 0 degrees elastic scattering can be used to monitor the transmission channel (through port). The optical resonances of the silicon microspheres provide the necessary narrow linewidths that are needed for high-resolution optical communication applications. Potential telecommunication applications include filters, modulators, switches, wavelength converters, detectors, amplifiers and light sources. Silicon microspheres show promise as potential building blocks for silicon-based electrophotonic integration.

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IOP Publishing Ltd

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Electrical eelectronics engineering, Materials science, Physics, Condensed matter

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Semiconductor Science and Technology

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10.1088/0268-1242/23/6/064009

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