Publication:
Sketch recognition with few examples

dc.contributor.departmentN/A
dc.contributor.departmentDepartment of Computer Engineering
dc.contributor.kuauthorYeşilbek, Kemal Tuğrul
dc.contributor.kuauthorSezgin, Tevfik Metin
dc.contributor.kuprofileMaster Student
dc.contributor.kuprofileFaculty Member
dc.contributor.otherDepartment of Computer Engineering
dc.contributor.schoolcollegeinstituteGraduate School of Sciences and Engineering
dc.contributor.schoolcollegeinstituteCollege of Engineering
dc.contributor.yokidN/A
dc.contributor.yokid18632
dc.date.accessioned2024-11-10T00:07:45Z
dc.date.issued2017
dc.description.abstractSketch recognition is the task of converting hand-drawn digital ink into symbolic computer representations. Since the early days of sketch recognition, the bulk of the work in the field focused on building accurate recognition algorithms for specific domains, and well defined data sets. Recognition methods explored so far have been developed and evaluated using standard machine learning pipelines and have consequently been built over many simplifying assumptions. For example, existing frameworks assume the presence of a fixed set of symbol classes, and the availability of plenty of annotated examples. However, in practice, these assumptions do not hold. In reality, the designer of a sketch recognition system starts with no labeled data at all, and faces the burden of data annotation. In this work, we propose to alleviate the burden of annotation by building systems that can learn from very few labeled examples, and large amounts of unlabeled data. Our systems perform self-learning by automatically extending a very small set of labeled examples with new examples extracted from unlabeled sketches. The end result is a sufficiently large set of labeled training data, which can subsequently be used to train classifiers. We present four self-learning methods with varying levels of implementation difficulty and runtime complexities. One of these methods leverages contextual co-occurrence patterns to build verifiably more diverse set of training instances. Rigorous experiments with large sets of data demonstrate that this novel approach based on exploiting contextual information leads to significant leaps in recognition performance. As a side contribution, we also demonstrate the utility of bagging for sketch recognition in imbalanced data sets with few positive examples and many outliers.
dc.description.indexedbyWoS
dc.description.indexedbyScopus
dc.description.openaccessNO
dc.description.volume69
dc.identifier.doi10.1016/j.cag.2017.08.016
dc.identifier.eissn1873-7684
dc.identifier.issn0097-8493
dc.identifier.scopus2-s2.0-85032667855
dc.identifier.urihttp://dx.doi.org/10.1016/j.cag.2017.08.016
dc.identifier.urihttps://hdl.handle.net/20.500.14288/16842
dc.identifier.wos418980500010
dc.keywordsSketch recognition
dc.keywordsLearning from few examples
dc.keywordsSelf-learning
dc.languageEnglish
dc.publisherPergamon-Elsevier Science Ltd
dc.sourceComputers and Graphics-Uk
dc.subjectComputer science
dc.subjectSoftware engineering
dc.titleSketch recognition with few examples
dc.typeJournal Article
dspace.entity.typePublication
local.contributor.authoridN/A
local.contributor.authorid0000-0002-1524-1646
local.contributor.kuauthorYeşilbek, Kemal Tuğrul
local.contributor.kuauthorSezgin, Tevfik Metin
relation.isOrgUnitOfPublication89352e43-bf09-4ef4-82f6-6f9d0174ebae
relation.isOrgUnitOfPublication.latestForDiscovery89352e43-bf09-4ef4-82f6-6f9d0174ebae

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