Publication:
Application of a design methodology using a 2D micro scanner

dc.conference.dateMAY 7-11, 2006
dc.conference.locationBoston, Massachusetts, USA
dc.conference.organizerNano Science and Technology Institute (NSTI)
dc.contributor.departmentDepartment of Mechanical Engineering
dc.contributor.facultymemberYes
dc.contributor.kuauthorAnaç, Ozan
dc.contributor.kuauthorBaşdoğan, İpek
dc.contributor.schoolcollegeinstituteCollege of Engineering
dc.date.accessioned2024-11-10T00:07:28Z
dc.date.issued2006
dc.description.abstractPredicting the performance of Micro Electro Mechanical Systems (MEMS) early in the design phase can impact the design cost and also improve the quality of the design. This paper presents a methodology which aims to predict the performance of such systems under various disturbance sources and develop a generalized design approach for micro structures. A two-dimensional torsional micro scanner mirror was chosen as the case study to demonstrate the developed methodologies. The finite element model (FEM) of the micro mirror was built using ANSYS software. An experimental vibration testing system was built to validate, update, and correct the finite element model. Validated finite element model was used to obtain the state space representation of the mirror. The state space model was used for disturbance analysis which was performed using Lyapunov approach to obtain root-mean-square (RMS) values of the mirror rotation angle under the effect of a disturbance torque. The disturbance analysis framework was combined with the sensitivity analysis to determine the critical design parameters for improving the system performance.
dc.description.fulltextNo
dc.description.harvestedfromManual
dc.description.indexedbyScopus
dc.description.openaccessYES
dc.description.peerreviewstatusN/A
dc.description.publisherscopeInternational
dc.description.readpublishN/A
dc.description.sponsoredbyTubitakEuN/A
dc.description.studentonlypublicationNo
dc.description.studentpublicationYes
dc.description.versionN/A
dc.identifier.WoSQuartileN/A
dc.identifier.embargoN/A
dc.identifier.scopus2-s2.0-33845200639
dc.identifier.urihttps://hdl.handle.net/20.500.14288/16771
dc.keywordsDesign of MEMS
dc.keywordsModal and sensitivity analysis Computer software
dc.keywordsFinite element method
dc.keywordsLogic design
dc.keywordsMicroelectromechanical devices
dc.keywordsMicromachining
dc.keywordsMicrostructure
dc.keywordsModal analysis
dc.keywordsSensitivity analysis
dc.keywordsState space methods
dc.keywordsDisturbance analysis
dc.keywordsRoot mean square (RMS) values
dc.keywordsState space representation
dc.keywordsScanning
dc.language.isoeng
dc.publisherTaylor & Francis
dc.relation.affiliationKoç University
dc.relation.collectionKoç University Institutional Repository
dc.relation.ispartof2006 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2006 Technical Proceedings
dc.relation.openaccessN/A
dc.rightsN/A
dc.subjectEngineering
dc.subjectMicroelectromechanical systems (MEMS)
dc.subjectDesign methodology
dc.titleApplication of a design methodology using a 2D micro scanner
dc.typeConference Proceeding
dspace.entity.typePublication
local.contributor.kuauthorBaşdoğan, İpek
local.contributor.kuauthorAnaç, Ozan
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