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On the reliability analysis of C-V2X Mode 4 for next generation connected vehicle applications

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dc.contributor.coauthorKaraağaç, Sercan
dc.contributor.departmentDepartment of Electrical and Electronics Engineering
dc.contributor.departmentGraduate School of Sciences and Engineering
dc.contributor.kuauthorErgen, Sinem Çöleri
dc.contributor.kuauthorKara, Yahya Şükür Can
dc.contributor.kuauthorKar, Emrah
dc.contributor.kuauthorKümeç, Feyzi Ege
dc.contributor.kuauthorReyhanoğlu, Aslıhan
dc.contributor.kuauthorTuran, Buğra
dc.contributor.schoolcollegeinstituteCollege of Engineering
dc.contributor.schoolcollegeinstituteGRADUATE SCHOOL OF SCIENCES AND ENGINEERING
dc.date.accessioned2024-11-09T23:03:34Z
dc.date.issued2022
dc.description.abstractVehicle-to-Everything Communication (V2X) technologies are provisioned to play an important role in increasing road safety by enabling advanced connected vehicle applications such as cooperative perception, cooperative driving, and remote driving. However, the reliability of the technology is limited mainly due to wireless communication channel characteristics. Therefore, investigation of V2X reliability aspects is crucial to utilize the technology efficiently. In this paper, we provide simulation and measurement-based reliability analysis of Cellular Vehicle-to-Everything (C-V2X) Mode 4 technology for various message sizes and Modulation and Coding Schemes (MCS) selections. We demonstrate that the Packet Delivery Ratio (PDR), a key communication performance metric, heavily depends on message size and selected MCS.
dc.description.indexedbyWOS
dc.description.indexedbyScopus
dc.description.openaccessNO
dc.description.publisherscopeInternational
dc.description.sponsoredbyTubitakEuN/A
dc.identifier.doi10.1109/VTC2022-Fall57202.2022.10012855
dc.identifier.isbn978-1-6654-5468-1
dc.identifier.issn2577-2465
dc.identifier.quartileN/A
dc.identifier.scopus2-s2.0-85147012921
dc.identifier.urihttps://doi.org/10.1109/VTC2022-Fall57202.2022.10012855
dc.identifier.urihttps://hdl.handle.net/20.500.14288/8471
dc.identifier.wos927580600161
dc.keywordsWireless communication
dc.keywordsAnalytical models
dc.keywordsVehicular and wireless technologies
dc.keywordsConnected vehicles
dc.keywordsInterference
dc.keywordsSize measurement
dc.keywordsRoad safety
dc.language.isoeng
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)
dc.relation.ispartof2022 IEEE 96th Vehicular Technology Conference (VTC 2022-Fall)
dc.subjectCivil Electrical electronics engineerings engineering
dc.subjectTelecommunication
dc.subjectTransportation
dc.subjectTechnology
dc.titleOn the reliability analysis of C-V2X Mode 4 for next generation connected vehicle applications
dc.typeConference Proceeding
dspace.entity.typePublication
local.contributor.kuauthorReyhanoğlu, Aslıhan
local.contributor.kuauthorKar, Emrah
local.contributor.kuauthorKümeç, Feyzi Ege
local.contributor.kuauthorKara, Yahya Şükür Can
local.contributor.kuauthorTuran, Buğra
local.contributor.kuauthorErgen, Sinem Çöleri
local.publication.orgunit1GRADUATE SCHOOL OF SCIENCES AND ENGINEERING
local.publication.orgunit1College of Engineering
local.publication.orgunit2Department of Electrical and Electronics Engineering
local.publication.orgunit2Graduate School of Sciences and Engineering
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relation.isOrgUnitOfPublication.latestForDiscovery21598063-a7c5-420d-91ba-0cc9b2db0ea0
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