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TXPES - a new soft X-ray Spectroscopy Beamline at the SESAME Synchrotron

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dc.conference.dateAUG 26-30, 2024
dc.conference.locationHamburg
dc.contributor.coauthorÖzensoy, E.
dc.contributor.coauthorAksoy, A.
dc.contributor.coauthorGundogdu, G.
dc.contributor.coauthorKantoğlu, Ö.
dc.contributor.coauthorYildirimdemir, B.
dc.contributor.coauthorÖztürk, Z. R.
dc.contributor.coauthorGenişel, M. F.
dc.contributor.coauthorNajdawi, M. A.
dc.contributor.coauthorLausi, A.
dc.contributor.coauthorLehner, F.
dc.contributor.coauthorEberhardt, W.
dc.contributor.coauthorDrube, W.
dc.contributor.coauthorFollath, R.
dc.contributor.departmentDepartment of Chemistry
dc.contributor.kuauthorKaya, Sarp
dc.contributor.schoolcollegeinstituteCollege of Sciences
dc.date.accessioned2026-08-14T11:27:52Z
dc.date.issued2025
dc.description.abstractThe Turkish Soft X-ray Photoelectron Spectroscopy (TXPES) beamline project at the Synchrotron-light for Experimental Science and Applications in the Middle East (SESAME) synchrotron, led by Turkish Energy Nuclear and Mineral Research Agency (TENMAK) is an important development as it marks SESAME’s first beamline fully designed, manufactured, and installed by a member country, Turkiye in 2025. TXPES will be installed on the free branch of the Helmholtz-SESAME Soft X-Ray Beamline (HESEB) and will share the same photon source and monochromator. The beamline will provide tunable photon energies ranging from 90 eV to 1800 eV for detailed analysis of the electronic structure and chemical bonding of materials. The end station supports techniques such as X-ray Photoelectron Spectroscopy (XPS), Ultraviolet Photoelectron Spectroscopy (UPS) and Low-Energy Ion Scattering (LEIS), thanks to advanced tools like the PHOIBOS 150 Complementary Metal-Oxide-Semiconductor (CMOS) XPS/LEIS/UPS Analyzer. With its versatile design and High-Pressure Cell (HPC), the TXPES system offers exceptional surface sensitivity, spatial resolution, and energy resolution, making it ideal for interdisciplinary research in physics, chemistry, materials science, and engineering.
dc.description.harvestedfromManual
dc.description.indexedbyScopus
dc.description.publisherscopeInternational
dc.description.readpublishN/A
dc.description.sponsoredbyTubitakEuN/A
dc.description.versionPublished Version
dc.identifier.ScopusPercentile23
dc.identifier.ScopusQuartileQ4
dc.identifier.WoSPercentileN/A
dc.identifier.WoSQuartileN/A
dc.identifier.doi10.1088/1742-6596/3010/1/012023
dc.identifier.eissn1742-6596
dc.identifier.embargoN/A
dc.identifier.issn1742-6588
dc.identifier.issue1
dc.identifier.scopus2-s2.0-105008002039
dc.identifier.urihttp://doi.org/10.1088/1742-6596/3010/1/012023
dc.identifier.urihttps://hdl.handle.net/20.500.14288/34687
dc.identifier.volume3010
dc.keywordsBeamline
dc.keywordsSynchrotron
dc.keywordsSynchrotron radiation
dc.keywordsSpectroscopy
dc.keywordsMaterials science
dc.keywordsOptics
dc.keywordsPhysics
dc.keywordsAstronomy
dc.languageeng
dc.publisherInstitute of Physics
dc.relation.affiliationKoç University
dc.relation.collectionKoç University Institutional Repository
dc.relation.ispartofJournal of Physics Conference Series
dc.relation.openaccessN/A
dc.rightsN/A
dc.rights.uriN/A
dc.subjectChemistry
dc.subjectMaterials science
dc.subjectSurfaces
dc.subjectCoatings and films
dc.titleTXPES - a new soft X-ray Spectroscopy Beamline at the SESAME Synchrotron
dc.typeConference Proceeding
dspace.entity.typePublication
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