Publication:
Characterization of finite photonic crystals

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dc.conference.dateDEC 08-11, 2008
dc.conference.locationSingapore, SINGAPORE
dc.conference.organizerIEEE PhotonicsGlobal at Singapore
dc.contributor.departmentDepartment of Electrical and Electronics Engineering
dc.contributor.facultymemberYes
dc.contributor.kuauthorAksun, M. İrşadi
dc.contributor.kuauthorKarabulut, Emine Pınar
dc.contributor.schoolcollegeinstituteCollege of Engineering
dc.date.accessioned2024-11-09T23:46:40Z
dc.date.issued2008
dc.description.abstractA new approach is proposed to obtain the dispersion characteristics of finite-extent photonic crystals. The method provides (w - k) diagram and information on the effective constitutive parameters of the structure and is applicable for general photonic crystals, that is, 1D, 2D and 3D photonic crystals with any kind of defects. The method utilizes the reflection data due to an incident plane wave at a given frequency, collected at the front interface of the photonic crystal for different numbers of unit cells. The reflection data can be obtained either analytically or by means of simulations or measurements. The method is verified on 1D and 2D perfect photonic crystals and 1D photonic crystal with defect.
dc.description.fulltextNo
dc.description.harvestedfromManual
dc.description.indexedbyWOS
dc.description.indexedbyScopus
dc.description.openaccessYES
dc.description.peerreviewstatusN/A
dc.description.publisherscopeInternational
dc.description.readpublishN/A
dc.description.sponsoredbyTubitakEuTÜBİTAK
dc.description.sponsorshipThis work has been supported by TUBITAK under contract No. 105E141.
dc.description.studentonlypublicationNo
dc.description.studentpublicationYes
dc.description.versionN/A
dc.identifier.WoSQuartileN/A
dc.identifier.doi10.1109/IPGC.2008.4781343
dc.identifier.embargoN/A
dc.identifier.grantno105E141
dc.identifier.isbn9781424429059
dc.identifier.scopus2-s2.0-67649649709
dc.identifier.urihttps://doi.org/10.1109/IPGC.2008.4781343
dc.identifier.urihttps://hdl.handle.net/20.500.14288/13980
dc.identifier.wos000267591100046
dc.keywords1-D photonic crystal
dc.keywords3D photonic crystals
dc.keywordsDispersion characteristics
dc.keywordsEffective constitutive parameters
dc.keywordsNew approaches
dc.keywordsPlane wave
dc.keywordsReflection data
dc.keywordsUnit cells
dc.keywordsCrystal atomic structure
dc.keywordsCrystal defects
dc.keywordsPhotonics
dc.keywordsSilicon on insulator technology
dc.keywordsPhotonic crystals
dc.language.isoeng
dc.publisherInstitute of Electrical and Electronics Engineers
dc.relation.affiliationKoç University
dc.relation.collectionKoç University Institutional Repository
dc.relation.ispartof2008 IEEE PhotonicsGlobal at Singapore, IPGC 2008
dc.relation.openaccessN/A
dc.rightsN/A
dc.subjectEngineering
dc.subjectElectrical and electronics engineering
dc.subjectOptics
dc.titleCharacterization of finite photonic crystals
dc.typeConference Proceeding
dspace.entity.typePublication
local.contributor.kuauthorKarabulut, Emine Pınar
local.contributor.kuauthorAksun, M. İrşadi
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relation.isParentOrgUnitOfPublication.latestForDiscovery8e756b23-2d4a-4ce8-b1b3-62c794a8c164

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