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Fourier-ring correlation resolution for time-resolved measurement in charged particle microscopy

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dc.contributor.coauthorAgarwal, Akshay
dc.contributor.coauthorGoyal, Vivek
dc.contributor.departmentDepartment of Computer Engineering
dc.contributor.schoolcollegeinstituteCollege of Engineering
dc.date.accessioned2025-01-19T10:31:30Z
dc.date.issued2023
dc.description.indexedbyScopus
dc.description.indexedbyPubMed
dc.description.issue1
dc.description.openaccessAll Open Access; Bronze Open Access
dc.description.publisherscopeInternational
dc.description.sponsoredbyTubitakEuN/A
dc.description.volume29
dc.identifier.doi10.1093/micmic/ozad067.360
dc.identifier.issn14358115
dc.identifier.quartileN/A
dc.identifier.scopus2-s2.0-85168578535
dc.identifier.urihttps://doi.org/10.1093/micmic/ozad067.360
dc.identifier.urihttps://hdl.handle.net/20.500.14288/26255
dc.language.isoeng
dc.publisherNLM (Medline)
dc.relation.ispartofMicroscopy and Microanalysis : The Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
dc.subjectComputer engineering
dc.titleFourier-ring correlation resolution for time-resolved measurement in charged particle microscopy
dc.typeJournal Article
dspace.entity.typePublication
local.contributor.kuauthorHitit, Oğuz Kağan
local.publication.orgunit1College of Engineering
local.publication.orgunit2Department of Computer Engineering
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