Publication: Fourier-ring correlation resolution for time-resolved measurement in charged particle microscopy
Program
School / College / Institute
College of Engineering
KU-Authors
KU Authors
Co-Authors
Agarwal, Akshay
Goyal, Vivek
Publication Date
Language
Type
Embargo Status
Journal Title
Journal ISSN
Volume Title
Alternative Title
Abstract
Source
Publisher
NLM (Medline)
Subject
Computer engineering
Citation
Has Part
Source
Microscopy and Microanalysis : The Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
Book Series Title
Edition
DOI
10.1093/micmic/ozad067.360