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Design framework for soft-error-resilient sequential cells

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dc.contributor.coauthorLee, Hsiao-Heng Kelin
dc.contributor.coauthorLilja, Klas
dc.contributor.coauthorBounasser, Mounaim
dc.contributor.coauthorLinscott, Ivan
dc.contributor.departmentDepartment of Electrical and Electronics Engineering
dc.contributor.kuauthorİnan, Umran Savaş
dc.contributor.schoolcollegeinstituteCollege of Engineering
dc.date.accessioned2024-11-09T23:42:20Z
dc.date.issued2011
dc.description.indexedbyWOS
dc.description.indexedbyScopus
dc.description.issue6
dc.description.openaccessNO
dc.description.publisherscopeInternational
dc.description.sponsoredbyTubitakEuN/A
dc.description.volume58
dc.identifier.doi10.1109/TNS.2011.2168611
dc.identifier.eissn1558-1578
dc.identifier.issn0018-9499
dc.identifier.quartileQ3
dc.identifier.scopus2-s2.0-83855160844
dc.identifier.urihttps://doi.org/10.1109/TNS.2011.2168611
dc.identifier.urihttps://hdl.handle.net/20.500.14288/13298
dc.identifier.wos301287400067
dc.language.isoN/A
dc.publisherIEEE Computer Society
dc.relation.ispartofIEEE Transactions on Nuclear Science
dc.subjectEngineering
dc.subjectElectrical Electronic Nuclear Science Technology
dc.titleDesign framework for soft-error-resilient sequential cells
dc.typeConference Proceeding
dspace.entity.typePublication
local.contributor.kuauthorİnan, Umran Savaş
local.publication.orgunit1College of Engineering
local.publication.orgunit2Department of Electrical and Electronics Engineering
relation.isOrgUnitOfPublication21598063-a7c5-420d-91ba-0cc9b2db0ea0
relation.isOrgUnitOfPublication.latestForDiscovery21598063-a7c5-420d-91ba-0cc9b2db0ea0
relation.isParentOrgUnitOfPublication8e756b23-2d4a-4ce8-b1b3-62c794a8c164
relation.isParentOrgUnitOfPublication.latestForDiscovery8e756b23-2d4a-4ce8-b1b3-62c794a8c164

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