Publication:
Design framework for soft-error-resilient sequential cells

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dc.conference.dateJUL 25-29, 2011
dc.conference.locationLas Vegas, NV
dc.conference.organizerIEEE Radiation Effects Data Workshop (REDW)/48th IEEE International Nuclear and Space Radiation Effects Conference (NSREC)
dc.contributor.coauthorLee, Hsiao-Heng Kelin
dc.contributor.coauthorLilja, Klas
dc.contributor.coauthorBounasser, Mounaim
dc.contributor.coauthorLinscott, Ivan
dc.contributor.departmentDepartment of Electrical and Electronics Engineering
dc.contributor.facultymemberYes
dc.contributor.kuauthorİnan, Umran Savaş
dc.contributor.schoolcollegeinstituteCollege of Engineering
dc.date.accessioned2024-11-09T23:42:20Z
dc.date.issued2011
dc.description.abstractThis paper presents a design framework for soft-error-resilient sequential cells, by introducing a new sequential cell called LEAP-DICE and evaluating it against existing circuit techniques in the "soft error resilience-power-delay-area" design space in an 180 nm CMOS test chip. LEAP-DICE, which employs both circuit and layout techniques, achieved the best soft error performance with a 2,000X improvement over the reference D flip-flop with moderate design costs. This study also discovered new soft error effects related to operating conditions.
dc.description.fulltextNo
dc.description.harvestedfromManual
dc.description.indexedbyWOS
dc.description.indexedbyScopus
dc.description.openaccessNO
dc.description.peerreviewstatusN/A
dc.description.publisherscopeInternational
dc.description.readpublishN/A
dc.description.sponsoredbyTubitakEuN/A
dc.description.studentonlypublicationNo
dc.description.studentpublicationNo
dc.description.versionN/A
dc.identifier.WoSQuartileQ2
dc.identifier.doi10.1109/TNS.2011.2168611
dc.identifier.eissn1558-1578
dc.identifier.embargoN/A
dc.identifier.endpage3032
dc.identifier.issn0018-9499
dc.identifier.issue6
dc.identifier.scopus2-s2.0-83855160844
dc.identifier.startpage3026
dc.identifier.urihttps://doi.org/10.1109/TNS.2011.2168611
dc.identifier.urihttps://hdl.handle.net/20.500.14288/13298
dc.identifier.volume58
dc.identifier.wos000301287400067
dc.language.isoeng
dc.publisherIEEE Computer Society
dc.relation.affiliationKoç University
dc.relation.collectionKoç University Institutional Repository
dc.relation.ispartofIEEE Transactions on Nuclear Science
dc.relation.openaccessN/A
dc.rightsN/A
dc.subjectEngineering
dc.subjectElectrical Electronic Nuclear Science Technology
dc.titleDesign framework for soft-error-resilient sequential cells
dc.typeConference Proceeding
dspace.entity.typePublication
local.contributor.kuauthorİnan, Umran Savaş
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relation.isOrgUnitOfPublication.latestForDiscovery21598063-a7c5-420d-91ba-0cc9b2db0ea0
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