Publication: Design framework for soft-error-resilient sequential cells
dc.contributor.coauthor | Lee, Hsiao-Heng Kelin | |
dc.contributor.coauthor | Lilja, Klas | |
dc.contributor.coauthor | Bounasser, Mounaim | |
dc.contributor.coauthor | Linscott, Ivan | |
dc.contributor.department | Department of Electrical and Electronics Engineering | |
dc.contributor.kuauthor | İnan, Umran Savaş | |
dc.contributor.schoolcollegeinstitute | College of Engineering | |
dc.date.accessioned | 2024-11-09T23:42:20Z | |
dc.date.issued | 2011 | |
dc.description.indexedby | WOS | |
dc.description.indexedby | Scopus | |
dc.description.issue | 6 | |
dc.description.openaccess | NO | |
dc.description.publisherscope | International | |
dc.description.sponsoredbyTubitakEu | N/A | |
dc.description.volume | 58 | |
dc.identifier.doi | 10.1109/TNS.2011.2168611 | |
dc.identifier.eissn | 1558-1578 | |
dc.identifier.issn | 0018-9499 | |
dc.identifier.quartile | Q3 | |
dc.identifier.scopus | 2-s2.0-83855160844 | |
dc.identifier.uri | https://doi.org/10.1109/TNS.2011.2168611 | |
dc.identifier.uri | https://hdl.handle.net/20.500.14288/13298 | |
dc.identifier.wos | 301287400067 | |
dc.language.iso | N/A | |
dc.publisher | IEEE Computer Society | |
dc.relation.ispartof | IEEE Transactions on Nuclear Science | |
dc.subject | Engineering | |
dc.subject | Electrical Electronic Nuclear Science Technology | |
dc.title | Design framework for soft-error-resilient sequential cells | |
dc.type | Conference Proceeding | |
dspace.entity.type | Publication | |
local.contributor.kuauthor | İnan, Umran Savaş | |
local.publication.orgunit1 | College of Engineering | |
local.publication.orgunit2 | Department of Electrical and Electronics Engineering | |
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relation.isOrgUnitOfPublication.latestForDiscovery | 21598063-a7c5-420d-91ba-0cc9b2db0ea0 | |
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