Publication:
Silicon microspheres in metrology

dc.contributor.departmentDepartment of Physics
dc.contributor.departmentMicrophotonics Research Laboratory
dc.contributor.facultymemberYes
dc.contributor.kuauthorAzeem, Farhan
dc.contributor.kuauthorGökay, Ulaş Sabahattin
dc.contributor.kuauthorHumayun, Muhammad Hamza
dc.contributor.kuauthorKhan, Imran
dc.contributor.kuauthorSerpengüzel, Ali
dc.contributor.schoolcollegeinstituteCollege of Sciences
dc.contributor.schoolcollegeinstituteLaboratory
dc.date.accessioned2024-11-09T22:57:42Z
dc.date.issued2015
dc.description.abstractThe Systeme International unit of mass is the kilogram. The present definition of the kg is based on a prototype dating back to 1880s. New approaches to define the unit of mass are being investigated. Avogadro Project uses 10 cm diameter single crystal silicon spheres. The technique commonly observed to measure the radius of the silicon sphere is optical interferometry. Here, we propose an alternate method of measuring the diameter of the single crystal silicon sphere using near-infrared spectroscopy. We demonstrate our approach by numerically simulating the electromagnetic coupling of a silicon microdisk of radius 5 μm to an optical waveguide of width 0.5 μm, thereby approximating the coupling of a microsphere to a rectangular optical waveguide. It might be possible to have a precise technique for determining the radius of the sphere, which can be used for the definition of the kilogram.
dc.description.fulltextNo
dc.description.harvestedfromManual
dc.description.indexedbyScopus
dc.description.openaccessYES
dc.description.peerreviewstatusN/A
dc.description.publisherscopeInternational
dc.description.readpublishN/A
dc.description.sponsoredbyTubitakEuN/A
dc.description.studentonlypublicationNo
dc.description.studentpublicationYes
dc.description.versionN/A
dc.identifier.WoSQuartileN/A
dc.identifier.embargoN/A
dc.identifier.endpage111
dc.identifier.isbn9781934142301
dc.identifier.issn1559-9450
dc.identifier.scopus2-s2.0-84947242088
dc.identifier.startpage108
dc.identifier.urihttps://hdl.handle.net/20.500.14288/7579
dc.identifier.volume2015-January
dc.keywordsInfrared devices
dc.keywordsMicrospheres
dc.keywordsNear infrared spectroscopy
dc.keywordsOptical waveguides
dc.keywordsSilicon
dc.keywordsSilicon wafers
dc.keywordsSingle crystals
dc.keywordsSpheres
dc.keywordsWaveguides
dc.language.isoeng
dc.publisherElectromagnetics Academy
dc.relation.affiliationKoç University
dc.relation.collectionKoç University Institutional Repository
dc.relation.ispartofProgress in Electromagnetics Research Symposium
dc.relation.openaccessN/A
dc.rightsN/A
dc.subjectPhysics
dc.titleSilicon microspheres in metrology
dc.typeConference Proceeding
dspace.entity.typePublication
local.contributor.kuauthorHumayun, Muhammad Hamza
local.contributor.kuauthorAzeem, Farhan
local.contributor.kuauthorKhan, Imran
local.contributor.kuauthorGökay, Ulaş Sabahattin
local.contributor.kuauthorSerpengüzel, Ali
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