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Defect dependent electronic properties of two-dimensional transition metal dichalcogenides (2H, 1T, and 1T′ phases)

dc.contributor.coauthorHanedar, Berna Akgenc
dc.contributor.departmentDepartment of Electrical and Electronics Engineering
dc.contributor.kuauthorOnbaşlı, Mehmet Cengiz
dc.contributor.schoolcollegeinstituteCollege of Engineering
dc.date.accessioned2025-03-06T20:59:58Z
dc.date.issued2024
dc.description.abstractTransition metal dichalcogenides (TMDs) exhibit a wide range of electronic properties due to their structural diversity. Understanding their defect-dependent properties might enable the design of efficient, bright, and long-lifetime quantum emitters. Here, we use density functional theory (DFT) calculations to investigate the 2H, 1T, and 1T ' phases of MoS2, WS2, MoSe2, WSe2 and the effect of defect densities on the electronic band structures, focusing on the influence of chalcogen vacancies. The 2H phase, which is thermodynamically stable, is a direct band gap semiconductor, while the 1T phase, despite its higher formation energy, exhibits metallic behavior. 1T phases with spin-orbit coupling show significant band inversions of 0.61, 0.77, 0.24 and 0.78 eV for MoS2, MoSe2, WS2 and WSe2, respectively. We discovered that for all four MX2 systems, the energy difference between 2H, 1T and 1T phases decreases with increasing concentration of vacancies (from 3.13% to 21.88%). Our findings show that the 2H phase also has minimum energy values depending on vacancies. TMDs containing W were found to have a wider bandgap compared to those containing Mo. The band gap of 2H WS2 decreased from 1.81 eV (1.54 eV with SOC included) under GGA calculations to a range of 1.37 eV to 0.79 eV, while the band gap of 2H MoSe2 reduced from 1.43 eV (1.31 eV with SOC) under GGA to a range of 0.98 eV to 0.06 eV, depending on the concentration. Our findings provide guidelines for experimental screening of 2D TMD defects, paving the way for the development of next-generation spintronic, electronic, and optoelectronic devices.
dc.description.indexedbyWOS
dc.description.indexedbyScopus
dc.description.indexedbyPubMed
dc.description.publisherscopeInternational
dc.description.sponsoredbyTubitakEuEU
dc.description.sponsorshipThis work was performed at the KUACC HPC Cluster and High Performance Grid Computing Center (TR-Grid e-Infrastructure) TUBITAK ULAKBIM. This study has been funded by the European Research Council (ERC) Starting Grant SKYNOLIMIT Grant No. 948063, the ERC Proof of Concept Grant SuperPHOTON Grant No. 101100718 and the U.S. Air Force Office of Scientific Research, European Office of Aerospace Research and Development, under grant FA8655-24-1-7033.
dc.identifier.doi10.1039/d4cp04017a
dc.identifier.eissn1463-9084
dc.identifier.grantnoEuropean Research Council [948063];European Research Council (ERC) Starting Grant SKYNOLIMIT [101100718];ERC [FA8655-24-1-7033];U.S. Air Force Office of Scientific Research, European Office of Aerospace Research and Development
dc.identifier.issn1463-9076
dc.identifier.issue4
dc.identifier.quartileQ1
dc.identifier.scopus2-s2.0-85212953393
dc.identifier.urihttps://doi.org/10.1039/d4cp04017a
dc.identifier.urihttps://hdl.handle.net/20.500.14288/27823
dc.identifier.volume27
dc.identifier.wos1379461300001
dc.keywordsTransition metal dichalcogenides (TMDs)
dc.keywordsDefect engineering
dc.keywordsElectronic properties
dc.keywords2D materials
dc.keywords2H phase
dc.keywords1T phase
dc.keywords1T′ phase
dc.keywordsBand structure
dc.keywordsSemiconductors
dc.keywordsDensity functional theory (DFT)
dc.language.isoeng
dc.publisherRoyal Society of Chemistry
dc.relation.ispartofPhysical Chemistry Chemical Physics
dc.subjectChemistry, physical
dc.subjectPhysics, atomic, molecular and chemical
dc.titleDefect dependent electronic properties of two-dimensional transition metal dichalcogenides (2H, 1T, and 1T′ phases)
dc.typeJournal Article
dc.type.otherEarly access
dspace.entity.typePublication
local.publication.orgunit1College of Engineering
local.publication.orgunit2Department of Electrical and Electronics Engineering
relation.isOrgUnitOfPublication21598063-a7c5-420d-91ba-0cc9b2db0ea0
relation.isOrgUnitOfPublication.latestForDiscovery21598063-a7c5-420d-91ba-0cc9b2db0ea0
relation.isParentOrgUnitOfPublication8e756b23-2d4a-4ce8-b1b3-62c794a8c164
relation.isParentOrgUnitOfPublication.latestForDiscovery8e756b23-2d4a-4ce8-b1b3-62c794a8c164

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