Publication:
Rigorous and efficient analysis of 3D printed circuits: vertical conductors arbitrarily distributed in multilayer environment

dc.contributor.coauthorKınayman, Noyan
dc.contributor.departmentN/A
dc.contributor.departmentDepartment of Electrical and Electronics Engineering
dc.contributor.kuauthorÖnal, Tayyar
dc.contributor.kuauthorAksun, M. İrşadi
dc.contributor.kuprofileMaster Student
dc.contributor.kuprofileFaculty Member
dc.contributor.otherDepartment of Electrical and Electronics Engineering
dc.contributor.schoolcollegeinstituteGraduate School of Sciences and Engineering
dc.contributor.schoolcollegeinstituteCollege of Engineering
dc.contributor.yokidN/A
dc.contributor.yokid28358
dc.date.accessioned2024-11-09T23:20:02Z
dc.date.issued2007
dc.description.abstractThe combination of the method of moments and the discrete complex image method is extended to multilayered printed circuits with vertical conductors crossing more than one layer and/or located in different layers. Some realistic printed circuits with multilayered vertical strips are analyzed, and results are compared either to those presented in the literature or to those obtained from the commercial software em by SONNET Software, North Syracuse, NY. In addition, it is demonstrated that this extension has facilitated the use of a recently developed algorithm, which was specifically developed for the efficient handling of multiple vertical conductors, for the analysis of structures with multiple vertical strips running in multilayer environment.
dc.description.indexedbyWoS
dc.description.indexedbyScopus
dc.description.issue12
dc.description.openaccessNO
dc.description.publisherscopeInternational
dc.description.volume55
dc.identifier.doi10.1109/TAP.2007.910498
dc.identifier.eissn1558-2221
dc.identifier.issn0018-926X
dc.identifier.quartileQ1
dc.identifier.scopus2-s2.0-37249008674
dc.identifier.urihttp://dx.doi.org/10.1109/TAP.2007.910498
dc.identifier.urihttps://hdl.handle.net/20.500.14288/10653
dc.identifier.wos251620500042
dc.keywordsDiscrete-complex-image method
dc.keywordsMethod of moments (MoM)
dc.keywordsMultilayered 3-D printed circuits
dc.keywordsIntegral-equation analysis
dc.keywordsElectromagnetic scattering
dc.languageEnglish
dc.publisherIEEE-Inst Electrical Electronics Engineers Inc
dc.sourceIEEE Transactions on Antennas and Propagation
dc.subjectEngineering
dc.subjectElectrical and electronic engineering
dc.subjectTelecommunications
dc.titleRigorous and efficient analysis of 3D printed circuits: vertical conductors arbitrarily distributed in multilayer environment
dc.typeJournal Article
dspace.entity.typePublication
local.contributor.authoridN/A
local.contributor.authorid0000-0003-0338-3476
local.contributor.kuauthorÖnal, Tayyar
local.contributor.kuauthorAksun, M. İrşadi
relation.isOrgUnitOfPublication21598063-a7c5-420d-91ba-0cc9b2db0ea0
relation.isOrgUnitOfPublication.latestForDiscovery21598063-a7c5-420d-91ba-0cc9b2db0ea0

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