Publication:
Dynamical electrical tuning of a silicon microsphere: used for spectral mapping of the optical resonances

dc.contributor.coauthorGurlu, Oguzhan
dc.contributor.coauthorThursby, Graham J.
dc.contributor.departmentDepartment of Physics
dc.contributor.departmentMicrophotonics Research Laboratory
dc.contributor.facultymemberYes
dc.contributor.kuauthorSerpengüzel, Ali
dc.contributor.kuauthorYüce, Emre
dc.contributor.schoolcollegeinstituteCollege of Sciences
dc.contributor.schoolcollegeinstituteLaboratory
dc.date.accessioned2024-11-09T22:58:20Z
dc.date.issued2014
dc.description.abstractIn this work, electrical square pulses at various duty cycles are applied to a silicon microsphere resonator in order to continuously tune the refractive index of a silicon microsphere and to map the optical resonance in the time domain. A continuous-wave semiconductor diode laser operating in the L-band is used for the excitation of the silicon microsphere optical resonances. The 90 degrees transverse magnetically polarized elastic scattering signal is used to monitor the silicon microsphere resonances. We show that at a constant input laser wavelength, up to five high-quality-factor optical resonances can be scanned by dynamical electrical tuning of the silicon microsphere cavity.
dc.description.fulltextNo
dc.description.harvestedfromManual
dc.description.indexedbyWOS
dc.description.indexedbyScopus
dc.description.indexedbyPubMed
dc.description.openaccessNO
dc.description.peerreviewstatusN/A
dc.description.publisherscopeInternational
dc.description.readpublishN/A
dc.description.sponsoredbyTubitakEuEU - TÜBİTAK
dc.description.sponsorshipTurkiye Bilimsel ve Teknolojik Arastirma Kurumu (TUBITAK) [EEEAG-106E215]
dc.description.sponsorshipEuropean Commission (EC) [FP6-IST-003887 NEMO, FP6-IST-511616 PHOREMOST]
dc.description.sponsorshipNWO-Nano This research was supported by Turkiye Bilimsel ve Teknolojik Arastirma Kurumu (TUBITAK) grant no. EEEAG-106E215, and the European Commission (EC) grant nos. FP6-IST-003887 NEMO, FP6-IST-511616 PHOREMOST, and NWO-Nano.
dc.description.studentonlypublicationNo
dc.description.studentpublicationYes
dc.description.versionN/A
dc.identifier.WoSQuartileQ3
dc.identifier.doi10.1364/AO.53.006181
dc.identifier.eissn2155-3165
dc.identifier.embargoN/A
dc.identifier.endpage6184
dc.identifier.issn1559-128X
dc.identifier.issue27
dc.identifier.pubmed25322095
dc.identifier.scopus2-s2.0-84942368481
dc.identifier.startpage6181
dc.identifier.urihttps://doi.org/10.1364/AO.53.006181
dc.identifier.urihttps://hdl.handle.net/20.500.14288/7697
dc.identifier.volume53
dc.identifier.wos000342000900037
dc.keywordsCrystalline Silicon
dc.keywordsWavelength
dc.language.isoeng
dc.publisherOptical Society of America
dc.relation.affiliationKoç University
dc.relation.collectionKoç University Institutional Repository
dc.relation.ispartofApplied Optics
dc.relation.openaccessN/A
dc.rightsN/A
dc.subjectOptics
dc.titleDynamical electrical tuning of a silicon microsphere: used for spectral mapping of the optical resonances
dc.typeJournal Article
dspace.entity.typePublication
local.contributor.kuauthorYüce, Emre
local.contributor.kuauthorSerpengüzel, Ali
relation.isGoalOfPublicationa9786601-9431-4553-9a46-013bb366fb87
relation.isGoalOfPublication.latestForDiscoverya9786601-9431-4553-9a46-013bb366fb87
relation.isOrgUnitOfPublicationc43d21f0-ae67-4f18-a338-bcaedd4b72a4
relation.isOrgUnitOfPublication21c87917-1acf-425c-bf6a-15e2ca9a08df
relation.isOrgUnitOfPublication.latestForDiscoveryc43d21f0-ae67-4f18-a338-bcaedd4b72a4
relation.isParentOrgUnitOfPublicationaf0395b0-7219-4165-a909-7016fa30932d
relation.isParentOrgUnitOfPublication20385dee-35e7-484b-8da6-ddcc08271d96
relation.isParentOrgUnitOfPublication.latestForDiscoveryaf0395b0-7219-4165-a909-7016fa30932d

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