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Training generative image super-resolution models by Wavelet-Domain Losses Enables Better Control of Artifacts

dc.contributor.departmentDepartment of Electrical and Electronics Engineering
dc.contributor.departmentKUIS AI (Koç University & İş Bank Artificial Intelligence Center)
dc.contributor.departmentGraduate School of Sciences and Engineering
dc.contributor.kuauthorTekalp, Ahmet Murat
dc.contributor.kuauthorKorkmaz, Cansu
dc.contributor.kuauthorDoğan, Zafer
dc.contributor.schoolcollegeinstituteCollege of Engineering
dc.contributor.schoolcollegeinstituteGRADUATE SCHOOL OF SCIENCES AND ENGINEERING
dc.contributor.schoolcollegeinstituteResearch Center
dc.date.accessioned2025-03-06T20:57:14Z
dc.date.issued2024
dc.description.abstractSuper-resolution (SR) is an ill-posed inverse problem, where the size of the set of feasible solutions that are consistent with a given low- resolution image is very large. Many algorithms have been proposed to find a "good" solution among the feasible solutions that strike a balance between fidelity and perceptual quality. Unfortunately, all known methods generate artifacts and hallucinations while trying to reconstruct high-frequency (HF) image details. A fundamental question is: Can a model learn to distinguish genuine image details from artifacts? Although some recent works focused on the differentiation of details and artifacts, this is a very challenging problem and a satisfactory solution is yet to be found. This paper shows that the characterization of genuine HF details versus artifacts can be better learned by training GAN-based SR models using wavelet-domain loss functions compared to RGB-domain or Fourier-space losses. Although wavelet-domain losses have been used in the literature before, they have not been used in the context of the SR task. More specifically, we train the discriminator only on the HF wavelet sub-bands instead of on RGB images and the generator is trained by a fidelity loss over wavelet subbands to make it sensitive to the scale and orientation of structures. Extensive experimental results demonstrate that our model achieves better perception-distortion trade-off according to multiple objective measures and visual evaluations.
dc.description.indexedbyWOS
dc.description.publisherscopeInternational
dc.description.sponsoredbyTubitakEuTÜBİTAK
dc.description.sponsorshipThis work is supported by TÜBİTAK 2247-A Award No. 120C156, TÜBİTAK 2232 Int. Fellowship for Outstanding Researchers Award No. 118C337, KUIS AI Center, and Turkish Academy of Sciences (TUBA).
dc.identifier.doi10.1109/CVPR52733.2024.00566
dc.identifier.grantnoTÜBİTAK 2247-A Award [120C156];TÜBİTAK 2232 Int. Fellowship for Outstanding Researchers Award [118C337];KUIS AI Center;Turkish Academy of Sciences (TUBA)
dc.identifier.isbn9798350353013
dc.identifier.isbn9798350353006
dc.identifier.issn1063-6919
dc.identifier.quartileN/A
dc.identifier.urihttps://doi.org/10.1109/CVPR52733.2024.00566
dc.identifier.urihttps://hdl.handle.net/20.500.14288/27159
dc.identifier.wos1322555906032
dc.keywordsComputer science
dc.keywordsElectrical and electronic
dc.keywordsTelecommunications
dc.language.isoeng
dc.publisherIEEE Computer Society
dc.relation.ispartof2024 IEEE/CVF CONFERENCE ON COMPUTER VISION AND PATTERN RECOGNITION, CVPR 2024
dc.subjectEngineering
dc.subjectElectrical and electronic
dc.titleTraining generative image super-resolution models by Wavelet-Domain Losses Enables Better Control of Artifacts
dc.typeConference Proceeding
dspace.entity.typePublication
local.contributor.kuauthorTekalp, Ahmet Murat
local.contributor.kuauthorKorkmaz, Cansu
local.contributor.kuauthorDoğan, Zafer
local.publication.orgunit1College of Engineering
local.publication.orgunit1GRADUATE SCHOOL OF SCIENCES AND ENGINEERING
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local.publication.orgunit2Department of Electrical and Electronics Engineering
local.publication.orgunit2KUIS AI (Koç University & İş Bank Artificial Intelligence Center)
local.publication.orgunit2Graduate School of Sciences and Engineering
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