Publication:
Vibration mode frequency formulae for micromechanical scanners

dc.contributor.coauthorKan, Cihan
dc.contributor.coauthorDavis, Wyatt O.
dc.contributor.departmentDepartment of Electrical and Electronics Engineering
dc.contributor.kuauthorÜrey, Hakan
dc.contributor.kuprofileFaculty Member
dc.contributor.otherDepartment of Electrical and Electronics Engineering
dc.contributor.schoolcollegeinstituteCollege of Engineering
dc.contributor.yokid8579
dc.date.accessioned2024-11-09T23:02:47Z
dc.date.issued2005
dc.description.abstractA torsional scan mirror suspended with two flexure beams can be used in various display, imaging and other scanning applications. Using various mirror shapes and flexure dimensions as parameters, a set of analytical formulae is presented to predict the natural frequency of the first five vibration modes, which are torsion, in-plane and out-of-plane sliding modes and in-plane and out-of-plane rocking modes. Mode frequencies are compared with the finite element model (FEM) predictions using ANSYS (TM) for a wide range of flexure beam dimensions. The formulae include the effective inertia of the flexure beams and orthotropic material anisotropy effects. The analytical formulae are verified for both isotropic (e.g. steel) and orthotropic (e.g. silicon) materials. These formulae work very well when the Euler-Bernoulli beam theory assumptions and the rigid miffor assumption are satisfied. The accuracy of analytical predictions is improved by introducing an empirical correction factor to the analytical predictions using non-dimensional flexure beam ratios. The correction factor reduces the error between analytical formulae and FEM predictions to within a few per cent for all five modes for a large range of flexure dimensions. FEM predictions and analytical formulae are partly verified by experimental results.
dc.description.indexedbyWoS
dc.description.indexedbyScopus
dc.description.issue9
dc.description.openaccessNO
dc.description.publisherscopeInternational
dc.description.volume15
dc.identifier.doi10.1088/0960-1317/15/9/013
dc.identifier.eissn1361-6439
dc.identifier.issn0960-1317
dc.identifier.quartileQ3
dc.identifier.scopus2-s2.0-23944496192
dc.identifier.urihttp://dx.doi.org/10.1088/0960-1317/15/9/013
dc.identifier.urihttps://hdl.handle.net/20.500.14288/8357
dc.identifier.wos232234500026
dc.keywordsN/A
dc.languageEnglish
dc.publisherInstitute of Physics (IOP) Publishing
dc.sourceJournal of Micromechanics and Microengineering
dc.subjectElectrical electronics engineering
dc.subjectNanoscience
dc.subjectNanotechnology
dc.subjectPhysics
dc.subjectPhysical instruments
dc.titleVibration mode frequency formulae for micromechanical scanners
dc.typeJournal Article
dspace.entity.typePublication
local.contributor.authorid0000-0002-2031-7967
local.contributor.kuauthorÜrey, Hakan
relation.isOrgUnitOfPublication21598063-a7c5-420d-91ba-0cc9b2db0ea0
relation.isOrgUnitOfPublication.latestForDiscovery21598063-a7c5-420d-91ba-0cc9b2db0ea0

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