Publication:
Thickness-dependent double-epitaxial growth in strained SrTi0.7Co0.3O3-delta films

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dc.contributor.coauthorTang, Astera S.
dc.contributor.coauthorSun, Xueyin
dc.contributor.coauthorRoss, Caroline A.
dc.contributor.departmentDepartment of Electrical and Electronics Engineering
dc.contributor.kuauthorOnbaşlı, Mehmet Cengiz
dc.contributor.schoolcollegeinstituteCollege of Engineering
dc.date.accessioned2024-11-10T00:04:38Z
dc.date.issued2018
dc.description.abstractPerovskite-structured SrTi0.7Co0.3O3-delta (STCo) films of varying thicknesses were grown on SrTiO3(001) substrates using pulsed laser deposition. Thin films grow with a cube-on-cube epitaxy, but for films exceeding a critical thickness of about 120 nm, a double-epitaxial microstructure was observed, in which (110)-oriented crystals nucleated within the (001)-oriented STCo matrix, both orientations being epitaxial with the substrate. The crystal structure, strain state, and magnetic properties are described as a function of film thickness. Both the magnetic moment and the coercivity show maxima at the critical thickness. The formation of a double-epitaxial microstructure provides a mechanism for strain relief in epitaxially mismatched films.
dc.description.indexedbyWOS
dc.description.indexedbyScopus
dc.description.indexedbyPubMed
dc.description.issue8
dc.description.openaccessNO
dc.description.publisherscopeInternational
dc.description.sponsoredbyTubitakEuN/A
dc.description.sponsorshipNSF [DMR-1419807]
dc.description.sponsorshipJunior Faculty Program Award (BAGEP)
dc.description.sponsorshipMRSEC Program of the National Science Foundation [DMR-1419807] The authors thank the MIT CMSE staff for instruction with data collection and analysis and, in particular, Charlie Settens for helpful discussions on the XRD data and Yong Zhang for guidance in collecting TEM data. The authors are grateful to Frances Ross of IBM for TEM strain mapping. This study was supported by NSF DMR-1419807 and made use of the Shared Experimental Facilities also supported in part by the MRSEC Program of the National Science Foundation under award number DMR-1419807. M.C.O. acknowledges Junior Faculty Program Award (BAGEP) 2017.
dc.description.volume10
dc.identifier.doi10.1021/acsami.7b18808
dc.identifier.eissn1944-8252
dc.identifier.issn1944-8244
dc.identifier.quartileQ1
dc.identifier.scopus2-s2.0-85042768135
dc.identifier.urihttps://doi.org/10.1021/acsami.7b18808
dc.identifier.urihttps://hdl.handle.net/20.500.14288/16301
dc.identifier.wos426618000076
dc.keywordsPerovskite
dc.keywordsThin film
dc.keywordsEpitaxy
dc.keywordsMagnetism
dc.keywordsPulsed laser deposition
dc.keywordsCo substitution
dc.language.isoeng
dc.publisherAmerican Chemical Society (ACS)
dc.relation.ispartofAcs Applied Materials & Interfaces
dc.subjectNanoscience
dc.subjectNanotechnology
dc.subjectMaterials science
dc.titleThickness-dependent double-epitaxial growth in strained SrTi0.7Co0.3O3-delta films
dc.typeJournal Article
dspace.entity.typePublication
local.contributor.kuauthorOnbaşlı, Mehmet Cengiz
local.publication.orgunit1College of Engineering
local.publication.orgunit2Department of Electrical and Electronics Engineering
relation.isOrgUnitOfPublication21598063-a7c5-420d-91ba-0cc9b2db0ea0
relation.isOrgUnitOfPublication.latestForDiscovery21598063-a7c5-420d-91ba-0cc9b2db0ea0
relation.isParentOrgUnitOfPublication8e756b23-2d4a-4ce8-b1b3-62c794a8c164
relation.isParentOrgUnitOfPublication.latestForDiscovery8e756b23-2d4a-4ce8-b1b3-62c794a8c164

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