Publication:
Modeling and characterization of comb-actuated resonant microscanners

dc.contributor.departmentN/A
dc.contributor.departmentDepartment of Electrical and Electronics Engineering
dc.contributor.kuauthorAtaman, Çağlar
dc.contributor.kuauthorÜrey, Hakan
dc.contributor.kuprofilePhD Student
dc.contributor.kuprofileFaculty Member
dc.contributor.otherDepartment of Electrical and Electronics Engineering
dc.contributor.schoolcollegeinstituteGraduate School of Sciences and Engineering
dc.contributor.schoolcollegeinstituteCollege of Engineering
dc.contributor.yokidN/A
dc.contributor.yokid8579
dc.date.accessioned2024-11-10T00:10:55Z
dc.date.issued2006
dc.description.abstractThe dynamics of the out-of-plane comb-drive actuator used in a torsional resonant mode microscanner is discussed. The microscanner is fabricated using the standard SOI technology by Fraunhofer, IPMS and utilized in various display, barcode scanning, spectroscopy and other imaging applications. The device is a parametrically excited system and exhibits hysteretic frequency response, nonlinear transient response, subharmonic oscillations, multiple parametric resonances, and alternating-oscillation-frequency behavior. Analytical and numerical models are developed to predict the parametric system dynamics. The analytical model is based on the solution of the linear Mathieu equation and valid for small angular displacements. The numerical model is valid for both small and large deflection angles. The analytical and numerical models are validated with the experimental results under various ambient pressures and excitation schemes and successfully predict the dynamics of the parametric nature of the microscanner. As many as four parametric resonances are observed at 30 mTorr. The models developed in this paper can be used to optimize the structure and the actuator.
dc.description.indexedbyWoS
dc.description.indexedbyScopus
dc.description.issue1
dc.description.openaccessNO
dc.description.publisherscopeInternational
dc.description.volume16
dc.identifier.doi10.1088/0960-1317/16/1/002
dc.identifier.eissn1361-6439
dc.identifier.issn0960-1317
dc.identifier.quartileQ3
dc.identifier.scopus2-s2.0-29144491918
dc.identifier.urihttp://dx.doi.org/10.1088/0960-1317/16/1/002
dc.identifier.urihttps://hdl.handle.net/20.500.14288/17372
dc.identifier.wos235182500002
dc.keywordsParametric resonance
dc.keywordsVibration
dc.languageEnglish
dc.publisherIop Publishing Ltd
dc.sourceJournal Of Micromechanics And Microengineering
dc.subjectEngineering
dc.subjectElectrical electronic engineering
dc.subjectNanoscience
dc.subjectNanotechnology
dc.subjectInstruments
dc.subjectInstrumentation
dc.subjectPhysics
dc.subjectApplied physics
dc.titleModeling and characterization of comb-actuated resonant microscanners
dc.typeJournal Article
dspace.entity.typePublication
local.contributor.authorid0000-0002-6280-8465
local.contributor.authorid0000-0002-2031-7967
local.contributor.kuauthorAtaman, Çağlar
local.contributor.kuauthorÜrey, Hakan
relation.isOrgUnitOfPublication21598063-a7c5-420d-91ba-0cc9b2db0ea0
relation.isOrgUnitOfPublication.latestForDiscovery21598063-a7c5-420d-91ba-0cc9b2db0ea0

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