Publication:
Two-axis electromagnetic microscanner for high resolution displays

dc.contributor.coauthorBrown, Dean
dc.contributor.coauthorMontague, Tom
dc.contributor.coauthorSprague, Randy
dc.contributor.departmentDepartment of Electrical and Electronics Engineering
dc.contributor.departmentDepartment of Electrical and Electronics Engineering
dc.contributor.kuauthorYalçınkaya, Arda Deniz
dc.contributor.kuauthorÜrey, Hakan
dc.contributor.kuprofileResearcher
dc.contributor.kuprofileFaculty Member
dc.contributor.otherDepartment of Electrical and Electronics Engineering
dc.contributor.schoolcollegeinstituteCollege of Engineering
dc.contributor.schoolcollegeinstituteCollege of Engineering
dc.contributor.yokid144523
dc.contributor.yokid8579
dc.date.accessioned2024-11-09T23:43:07Z
dc.date.issued2006
dc.description.abstractA novel microelectromechanical systems (MEMS) actuation technique is developed for retinal scanning display and imaging applications allowing effective drive of a two-axes scanning mirror to wide angles at high frequency. Modeling of the device in mechanical and electrical domains, as well as the experimental characterization is described. Full optical scan angles of 65 degrees and 53 degrees are achieved for slow (60 Hz; sawtooth) and fast (21.3 kHz sinusoid) scan directions, respectively. In combination with a mirror size of 1.5 mm, a resulting theta D-opt product of 79.5 deg(.)mm for fast axis is obtained. This two-dimensional (2-D) magnetic actuation technique delivers sufficient torque to allow non-resonant operation as low as dc in the slow-scan axis while at the same time allowing one-atmosphere operation even at fast-scan axis frequencies large enough to support SXGA (1280 x 1024) resolution scanned beam displays.
dc.description.indexedbyWoS
dc.description.indexedbyScopus
dc.description.issue4
dc.description.openaccessYES
dc.description.publisherscopeInternational
dc.description.volume15
dc.identifier.doi10.1109/JMEMS.2006.879380
dc.identifier.eissn1941-0158
dc.identifier.issn1057-7157
dc.identifier.scopus2-s2.0-33747425622
dc.identifier.urihttp://dx.doi.org/10.1109/JMEMS.2006.879380
dc.identifier.urihttps://hdl.handle.net/20.500.14288/13441
dc.identifier.wos239712600008
dc.keywordsOptical scanner
dc.keywordsPerformance
dc.languageEnglish
dc.publisherIEEE-Inst Electrical Electronics Engineers Inc
dc.sourceJournal of Microelectromechanical Systems
dc.subjectElectrical electronics engineering
dc.subjectNanoscience
dc.subjectNanotechnology
dc.subjectPhysics
dc.subjectPhysical instruments
dc.titleTwo-axis electromagnetic microscanner for high resolution displays
dc.typeJournal Article
dspace.entity.typePublication
local.contributor.authorid0000-0002-6603-1198
local.contributor.authorid0000-0002-2031-7967
local.contributor.kuauthorYalçınkaya, Arda Deniz
local.contributor.kuauthorÜrey, Hakan
relation.isOrgUnitOfPublication21598063-a7c5-420d-91ba-0cc9b2db0ea0
relation.isOrgUnitOfPublication.latestForDiscovery21598063-a7c5-420d-91ba-0cc9b2db0ea0

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