Silicon microspheres - art. no. 61010K

Abstract

Morphology-dependent resonances are observed in silicon microspheres, both in the transmission and elastic scattering spectra in the O-band. Approximately 23% of the power is coupled out at the resonance wavelength. The highest observed quality factor for the morphology dependent resonances was on the order of 10(5). These resonances have a linewidth of 0.007 nm and a mode spacing of 0.19 nm.