Publication:
Microsphere based resonant cavity silicon photodetector

dc.contributor.departmentDepartment of Electrical and Electronics Engineering
dc.contributor.departmentDepartment of Physics
dc.contributor.kuauthorBilici, Temel
dc.contributor.kuauthorİşçi, Şenol
dc.contributor.kuauthorKurt, Adnan
dc.contributor.kuauthorSerpengüzel, Ali
dc.contributor.schoolcollegeinstituteCollege of Engineering
dc.contributor.schoolcollegeinstituteCollege of Sciences
dc.date.accessioned2024-11-09T12:40:47Z
dc.date.issued2004
dc.description.abstractMicro Electro Mechanical Systems (MEMS) are among the new and emerging technologies of the future and have many applications in different disciplines. This study presents the dynamic characterization methods that we use to identify the modal parameters of a MEMS device and also the techniques that can be implemented to change the modal parameters. A micro scanner mirror was chosen as the case study to demonstrate the developed methodologies. Initially, the micro mirror was dynamically characterized using experimental modal analysis techniques to identify the modal parameters such as resonance frequencies and mode shapes. Then, it was introduced in a velocity feedback control loop to alter the effective damping of the structure. This method proves to be a very efficient method to alter the modal damping of a micro structure, especially when high quality factors are required for MEMS applications.
dc.description.fulltextYES
dc.description.indexedbyWOS
dc.description.indexedbyScopus
dc.description.openaccessYES
dc.description.publisherscopeInternational
dc.description.sponsoredbyTubitakEuN/A
dc.description.sponsorshipN/A
dc.description.versionPublisher version
dc.identifier.doi10.1117/12579479
dc.identifier.eissn1996-756X
dc.identifier.embargoNO
dc.identifier.filenameinventorynoIR00705
dc.identifier.isbn0-8194-5265-3
dc.identifier.issn0277-786X
dc.identifier.quartileN/A
dc.identifier.scopus2-s2.0-4344672309
dc.identifier.urihttps://doi.org/10.1117/12579479
dc.identifier.wos223059100016
dc.keywordsChannel dropping filter
dc.keywordsDielectric microsphere
dc.keywordsEvanescent coupling
dc.keywordsIntegrated optoelectronics
dc.keywordsMicrosphere resonator
dc.keywordsMorphology dependent resonances
dc.keywordsOptical resonance
dc.keywordsOptical coupler
dc.keywordsOptical fiber
dc.keywordsSilicon photodetector
dc.keywordsWhispering gallery modes
dc.language.isoeng
dc.publisherSociety of Photo-optical Instrumentation Engineers (SPIE)
dc.relation.ispartofProceedings of SPIE
dc.relation.urihttp://cdm21054.contentdm.oclc.org/cdm/ref/collection/IR/id/712
dc.subjectElectrical and electronic engineering
dc.subjectOptics
dc.titleMicrosphere based resonant cavity silicon photodetector
dc.typeConference Proceeding
dspace.entity.typePublication
local.contributor.kuauthorSerpengüzel, Ali
local.contributor.kuauthorBilici, Temel
local.contributor.kuauthorİşçi, Şenol
local.contributor.kuauthorKurt, Adnan
local.publication.orgunit1College of Sciences
local.publication.orgunit1College of Engineering
local.publication.orgunit2Department of Physics
local.publication.orgunit2Department of Electrical and Electronics Engineering
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relation.isOrgUnitOfPublicationc43d21f0-ae67-4f18-a338-bcaedd4b72a4
relation.isOrgUnitOfPublication.latestForDiscovery21598063-a7c5-420d-91ba-0cc9b2db0ea0
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relation.isParentOrgUnitOfPublication.latestForDiscovery8e756b23-2d4a-4ce8-b1b3-62c794a8c164

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