Publication:
Reliability of semi-Markov missions

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dc.contributor.coauthorCekyay, Bora
dc.contributor.departmentDepartment of Industrial Engineering
dc.contributor.facultymemberYes
dc.contributor.kuauthorÖzekici, Süleyman
dc.contributor.schoolcollegeinstituteCollege of Engineering
dc.date.accessioned2024-11-09T23:43:30Z
dc.date.issued2019
dc.description.abstractWe consider a device that is designed to perform missions consisting of a random sequence of phases or stages with random durations. The mission process is described by a Markov renewal process and the system is a complex one consisting of a number of components whose lifetimes depend on the phases of the mission. We discuss models and tools to compute system, mission, and phase reliabilities using Markov renewal theory. A simplified model involving a mission-based system with maximal repair is analyzed first, and the results are then extended to the case where there is no repair using intrinsic aging concepts. Our objective is to focus on computation of system reliability for these two possible extreme cases.
dc.description.fulltextNo
dc.description.harvestedfromManual
dc.description.indexedbyWOS
dc.description.indexedbyScopus
dc.description.openaccessNO
dc.description.peerreviewstatusN/A
dc.description.publisherscopeInternational
dc.description.readpublishN/A
dc.description.sponsoredbyTubitakEuTÜBİTAK
dc.description.sponsorshipScientific and Technological Research Council of Turkey [106M044]. This research is funded by the Scientific and Technological Research Council of Turkey through grant 106M044.
dc.description.studentonlypublicationNo
dc.description.studentpublicationNo
dc.description.versionN/A
dc.identifier.WoSQuartileQ4
dc.identifier.doi10.1080/15326349.2019.1577142
dc.identifier.eissn1532-4214
dc.identifier.embargoN/A
dc.identifier.endpage88
dc.identifier.issn1532-6349
dc.identifier.issue1
dc.identifier.scopus2-s2.0-85065038153
dc.identifier.startpage63
dc.identifier.urihttps://doi.org/10.1080/15326349.2019.1577142
dc.identifier.urihttps://hdl.handle.net/20.500.14288/13497
dc.identifier.volume35
dc.identifier.wos000466412900003
dc.keywordsMission reliability
dc.keywordsMarkov renewal process
dc.keywordsIntrinsic aging
dc.keywordsMaximal repair
dc.keywordsNo repair
dc.language.isoeng
dc.publisherTaylor and Francis
dc.relation.affiliationKoç University
dc.relation.collectionKoç University Institutional Repository
dc.relation.ispartofStochastic Models
dc.relation.openaccessN/A
dc.rightsN/A
dc.subjectStatistics and probability
dc.titleReliability of semi-Markov missions
dc.typeJournal Article
dspace.entity.typePublication
local.contributor.kuauthorÖzekici, Süleyman
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