Publication:
Dynamic characterization and modification of dynamic properties of a micro scanner

dc.contributor.departmentDepartment of Mechanical Engineering
dc.contributor.facultymemberYes
dc.contributor.kuauthorBaşdoğan, İpek
dc.contributor.kuauthorVeryeri, Ilgar
dc.contributor.schoolcollegeinstituteCollege of Engineering
dc.date.accessioned2024-11-09T22:56:37Z
dc.date.issued2010
dc.description.abstractMicro electro mechanical systems (MEMS) are used in many application areas in different disciplines and took their place among the most promising technologies. The performance of such systems is primarily related to their dynamical characteristics. This study presents the dynamic characterization techniques that are used to identify the modal parameters of a MEMS device and the methods that can be implemented to change its dynamic response. An electrostatic scanner is chosen as the case study to demonstrate the developed methodologies. Initially, the micro scanner is characterized using experimental modal analysis techniques to obtain frequency response function, modal damping, resonance frequencies, and mode shapes. Then, velocity and position feedback control loops are implemented to the scanner system to alter the damping and stiffness characteristics. A closed-loop Simulink model of the scanner is developed to verify the experimental measurements. Several curve fitting methods are used in order to have an accurate representation of the scanner system. Using the model, the influence of both position and velocity feedback on the effective damping, resonance frequency and the transient behavior of the scanner is investigated. The stability limits of the scanner under velocity feedback are also studied via numerical simulations. Based on the experimental and simulation results, the methodology developed in this study proves itself to be very efficient to alter the dynamical characteristics of the MEMS structures and it can be easily adapted to other MEMS applications.
dc.description.fulltextNo
dc.description.harvestedfromManual
dc.description.indexedbyWOS
dc.description.indexedbyScopus
dc.description.openaccessNO
dc.description.peerreviewstatusN/A
dc.description.publisherscopeInternational
dc.description.readpublishN/A
dc.description.sponsoredbyTubitakEuN/A
dc.description.studentonlypublicationNo
dc.description.studentpublicationYes
dc.description.versionN/A
dc.identifier.WoSQuartileQ3
dc.identifier.doi10.1007/s00542-010-1074-0
dc.identifier.eissn1432-1858
dc.identifier.embargoN/A
dc.identifier.endpage992
dc.identifier.issn0946-7076
dc.identifier.issue6
dc.identifier.scopus2-s2.0-77952420546
dc.identifier.startpage979
dc.identifier.urihttps://doi.org/10.1007/s00542-010-1074-0
dc.identifier.urihttps://hdl.handle.net/20.500.14288/7409
dc.identifier.volume16
dc.identifier.wos000276975500011
dc.keywordsMEMS
dc.keywordsModal analysis
dc.keywordsElectrostatic scanner
dc.keywordsFeedback control
dc.language.isoeng
dc.publisherSpringer Heidelberg
dc.relation.affiliationKoç University
dc.relation.collectionKoç University Institutional Repository
dc.relation.ispartofMicrosystem Technologies-Micro-and Nanosystems-Information Storage and Processing Systems
dc.relation.openaccessN/A
dc.rightsN/A
dc.subjectElectrical engineering
dc.subjectElectronics engineering
dc.subjectNanoscience
dc.subjectNanotechnology
dc.subjectPhysics
dc.subjectMaterials science
dc.titleDynamic characterization and modification of dynamic properties of a micro scanner
dc.typeJournal Article
dspace.entity.typePublication
local.contributor.kuauthorVeryeri, Ilgar
local.contributor.kuauthorBaşdoğan, İpek
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