Publication:
High-speed broadband FTIR system using MEMS

dc.contributor.coauthorStehle, Jean-Louis
dc.contributor.departmentDepartment of Electrical and Electronics Engineering
dc.contributor.departmentGraduate School of Sciences and Engineering
dc.contributor.kuauthorAyerden, Nadire Pelin
dc.contributor.kuauthorAygün, Uğur
dc.contributor.kuauthorCan, Başarbatu
dc.contributor.kuauthorHolmstrom, Sven
dc.contributor.kuauthorÖlçer, Selim
dc.contributor.kuauthorÜrey, Hakan
dc.contributor.schoolcollegeinstituteCollege of Engineering
dc.contributor.schoolcollegeinstituteGRADUATE SCHOOL OF SCIENCES AND ENGINEERING
dc.date.accessioned2024-11-09T23:27:57Z
dc.date.issued2014
dc.description.abstractCurrent Fourier transform infrared spectroscopy (FTIR) systems have very good spectral resolution, but are bulky, sensitive to vibrations, and slow. We developed a new FTIR system using a microelectromechanical system (MEMS)-based lamellar grating interferometer that is fast, compact, and achromatic (i.e., does not require a beam splitter). The MEMS device has > 10 mm(2) active surface area, up to +/- 325 mu m mechanical displacement, and a 343 Hz resonant operation frequency. The system uses a 5 MHz bandwidth custom infrared (IR) detector and a small emission area custom blackbody source to achieve fast interferogram acquisition and compact form factor. Effects of lamellar grating period, detector size, laser reference, apodization, and averaging of data on the spectral resolution are discussed. The measurement time ranges from 1.5 to 100 ms depending on the averaging time. In the target range of 2.5-16 mu m (625- 4000 cm(-1)) a spectral resolution of 15-20 cm(-1) is demonstrated. The measurements are shown to be stable over a long time. (C) 2014 Optical Society of America
dc.description.indexedbyWOS
dc.description.issue31
dc.description.openaccessNO
dc.description.sponsoredbyTubitakEuN/A
dc.description.sponsorshipMEMFIS - European Commission [224151]
dc.description.sponsorshipEPFL The authors would like to thank all MEMFIS project partners. This work was supported by the MEMFIS Project, funded by the European Commission Seventh Framework Program under grant 224151. The authors would also like to thank H. R. Seren for the mechanical device design, the Center of Micronanotechnology (CMI) at Ecole Polytechnique Federale de Lausanne (EPFL) for help with the microfabrication, and P. Fluckiger and Y. Leblebici from EPFL for support and help.
dc.description.volume53
dc.identifier.doi10.1364/AO.53.007267
dc.identifier.eissn2155-3165
dc.identifier.issn1559-128X
dc.identifier.urihttps://doi.org/10.1364/AO.53.007267
dc.identifier.urihttps://hdl.handle.net/20.500.14288/11798
dc.identifier.wos343919400024
dc.keywordsSpectroscopy
dc.keywordsMicroactuators
dc.language.isoeng
dc.publisherOptical Soc Amer
dc.relation.ispartofApplied Optics
dc.subjectOptics
dc.titleHigh-speed broadband FTIR system using MEMS
dc.typeJournal Article
dspace.entity.typePublication
local.contributor.kuauthorAyerden, Nadire Pelin
local.contributor.kuauthorAygün, Uğur
local.contributor.kuauthorHolmstrom, Sven
local.contributor.kuauthorÖlçer, Selim
local.contributor.kuauthorCan, Başarbatu
local.contributor.kuauthorÜrey, Hakan
local.publication.orgunit1GRADUATE SCHOOL OF SCIENCES AND ENGINEERING
local.publication.orgunit1College of Engineering
local.publication.orgunit2Department of Electrical and Electronics Engineering
local.publication.orgunit2Graduate School of Sciences and Engineering
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