Publication: High-speed broadband FTIR system using MEMS
dc.contributor.coauthor | Stehle, Jean-Louis | |
dc.contributor.department | Department of Electrical and Electronics Engineering | |
dc.contributor.department | Graduate School of Sciences and Engineering | |
dc.contributor.kuauthor | Ayerden, Nadire Pelin | |
dc.contributor.kuauthor | Aygün, Uğur | |
dc.contributor.kuauthor | Can, Başarbatu | |
dc.contributor.kuauthor | Holmstrom, Sven | |
dc.contributor.kuauthor | Ölçer, Selim | |
dc.contributor.kuauthor | Ürey, Hakan | |
dc.contributor.schoolcollegeinstitute | College of Engineering | |
dc.contributor.schoolcollegeinstitute | GRADUATE SCHOOL OF SCIENCES AND ENGINEERING | |
dc.date.accessioned | 2024-11-09T23:27:57Z | |
dc.date.issued | 2014 | |
dc.description.abstract | Current Fourier transform infrared spectroscopy (FTIR) systems have very good spectral resolution, but are bulky, sensitive to vibrations, and slow. We developed a new FTIR system using a microelectromechanical system (MEMS)-based lamellar grating interferometer that is fast, compact, and achromatic (i.e., does not require a beam splitter). The MEMS device has > 10 mm(2) active surface area, up to +/- 325 mu m mechanical displacement, and a 343 Hz resonant operation frequency. The system uses a 5 MHz bandwidth custom infrared (IR) detector and a small emission area custom blackbody source to achieve fast interferogram acquisition and compact form factor. Effects of lamellar grating period, detector size, laser reference, apodization, and averaging of data on the spectral resolution are discussed. The measurement time ranges from 1.5 to 100 ms depending on the averaging time. In the target range of 2.5-16 mu m (625- 4000 cm(-1)) a spectral resolution of 15-20 cm(-1) is demonstrated. The measurements are shown to be stable over a long time. (C) 2014 Optical Society of America | |
dc.description.indexedby | WOS | |
dc.description.issue | 31 | |
dc.description.openaccess | NO | |
dc.description.sponsoredbyTubitakEu | N/A | |
dc.description.sponsorship | MEMFIS - European Commission [224151] | |
dc.description.sponsorship | EPFL The authors would like to thank all MEMFIS project partners. This work was supported by the MEMFIS Project, funded by the European Commission Seventh Framework Program under grant 224151. The authors would also like to thank H. R. Seren for the mechanical device design, the Center of Micronanotechnology (CMI) at Ecole Polytechnique Federale de Lausanne (EPFL) for help with the microfabrication, and P. Fluckiger and Y. Leblebici from EPFL for support and help. | |
dc.description.volume | 53 | |
dc.identifier.doi | 10.1364/AO.53.007267 | |
dc.identifier.eissn | 2155-3165 | |
dc.identifier.issn | 1559-128X | |
dc.identifier.uri | https://doi.org/10.1364/AO.53.007267 | |
dc.identifier.uri | https://hdl.handle.net/20.500.14288/11798 | |
dc.identifier.wos | 343919400024 | |
dc.keywords | Spectroscopy | |
dc.keywords | Microactuators | |
dc.language.iso | eng | |
dc.publisher | Optical Soc Amer | |
dc.relation.ispartof | Applied Optics | |
dc.subject | Optics | |
dc.title | High-speed broadband FTIR system using MEMS | |
dc.type | Journal Article | |
dspace.entity.type | Publication | |
local.contributor.kuauthor | Ayerden, Nadire Pelin | |
local.contributor.kuauthor | Aygün, Uğur | |
local.contributor.kuauthor | Holmstrom, Sven | |
local.contributor.kuauthor | Ölçer, Selim | |
local.contributor.kuauthor | Can, Başarbatu | |
local.contributor.kuauthor | Ürey, Hakan | |
local.publication.orgunit1 | GRADUATE SCHOOL OF SCIENCES AND ENGINEERING | |
local.publication.orgunit1 | College of Engineering | |
local.publication.orgunit2 | Department of Electrical and Electronics Engineering | |
local.publication.orgunit2 | Graduate School of Sciences and Engineering | |
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