Innovative MEMS stage for automated micromechanical testing
dc.contributor.authorid | 0000-0002-2712-1908 | |
dc.contributor.authorid | 0000-0003-2063-1566 | |
dc.contributor.authorid | N/A | |
dc.contributor.authorid | 0000-0001-5931-8134 | |
dc.contributor.authorid | N/A | |
dc.contributor.department | N/A | |
dc.contributor.department | N/A | |
dc.contributor.department | N/A | |
dc.contributor.department | Department of Mechanical Engineering | |
dc.contributor.department | N/A | |
dc.contributor.kuauthor | Karimzadehkhouei, Mehrdad | |
dc.contributor.kuauthor | Ali, Basit | |
dc.contributor.kuauthor | Zare Pakzad, Sina | |
dc.contributor.kuauthor | Alaca, Burhanettin Erdem | |
dc.contributor.kuauthor | Çoban, Semih Berk | |
dc.contributor.kuprofile | Researcher | |
dc.contributor.kuprofile | PhD Student | |
dc.contributor.kuprofile | PhD Student | |
dc.contributor.kuprofile | Faculty Member | |
dc.contributor.kuprofile | PhD Student | |
dc.contributor.researchcenter | Koç University Surface Science and Technology Center (KUYTAM) / Koç Üniversitesi Yüzey Teknolojileri Araştırmaları Merkezi (KUYTAM) | |
dc.contributor.researchcenter | n2STAR-Koç University Nanofabrication and Nanocharacterization Center for Scientifc and Technological Advanced Research | |
dc.contributor.schoolcollegeinstitute | N/A | |
dc.contributor.schoolcollegeinstitute | Graduate School of Sciences and Engineering | |
dc.contributor.schoolcollegeinstitute | Graduate School of Sciences and Engineering | |
dc.contributor.schoolcollegeinstitute | College of Engineering | |
dc.contributor.schoolcollegeinstitute | Graduate School of Sciences and Engineering | |
dc.contributor.yokid | N/A | |
dc.contributor.yokid | N/A | |
dc.contributor.yokid | N/A | |
dc.contributor.yokid | 115108 | |
dc.contributor.yokid | N/A | |
dc.date.accessioned | 2025-01-19T10:33:38Z | |
dc.date.issued | 2023 | |
dc.description.abstract | This study introduces a comprehensive methodology for designing, fabricating, and testing a MEMS stage integrated into a commercial testing device, with a focus on enabling automated testing of multiple samples under in-plane loading conditions. Drawing inspiration from recent innovative MEMS stage designs, a new approach is developed to integrate micromanipulator tips into a commercial micro-mechanical testing machine, allowing for automated one-directional loading of micro-scale samples. To address challenges related to handling and alignment, a co-fabrication technique is employed, enabling the simultaneous fabrication of the micro-sample and MEMS stage within a single process flow. A novel fabrication method utilizing a silicon-on-insulator substrate is utilized. The calibration of testing method is conducted using both analytical and experimental methods to ensure accurate measurement of force and deflection within the in-plane testing protocol. The released micro-beam structures undergo repetitive loading to evaluate bending deformation. The developed approach is extended to multiple testing attempts on MEMS stage-micro-sample, combinations co-fabricated within a single chip, enabling precise statistical treatment of the measurements. © 2023 IEEE. | |
dc.description.indexedby | Scopus | |
dc.description.publisherscope | International | |
dc.identifier.doi | 10.1109/MARSS58567.2023.10294157 | |
dc.identifier.isbn | 979-835033039-7 | |
dc.identifier.quartile | N/A | |
dc.identifier.scopus | 2-s2.0-85177482183 | |
dc.identifier.uri | https://doi.org/10.1109/MARSS58567.2023.10294157 | |
dc.identifier.uri | https://hdl.handle.net/20.500.14288/26642 | |
dc.keywords | Automation | |
dc.keywords | Fabrication | |
dc.keywords | Mechanical testing | |
dc.keywords | MEMS | |
dc.keywords | Silicon on insulator technology | |
dc.keywords | Silicon wafers | |
dc.language | en | |
dc.publisher | Institute of Electrical and Electronics Engineers Inc. | |
dc.source | Proceedings of MARSS 2023 - 6th International Conference on Manipulation, Automation, and Robotics at Small Scales | |
dc.subject | Mechanical engineering | |
dc.title | Innovative MEMS stage for automated micromechanical testing | |
dc.type | Conference proceeding |