Silicon nanowires driving miniaturization of microelectromechanical systems physical sensors: a review

dc.contributor.authorid0000-0002-2712-1908
dc.contributor.authorid0000-0003-2063-1566
dc.contributor.authorid0000-0002-7702-0566
dc.contributor.authorid0000-0001-5931-8134
dc.contributor.departmentN/A
dc.contributor.departmentN/A
dc.contributor.departmentN/A
dc.contributor.departmentDepartment of Mechanical Engineering
dc.contributor.kuauthorKarimzadehkhouei, Mehrdad
dc.contributor.kuauthorAli, Basit
dc.contributor.kuauthorGhourichaei, Masoud Jedari
dc.contributor.kuauthorAlaca, Burhanettin Erdem
dc.contributor.kuprofileResearcher
dc.contributor.kuprofilePhD Student
dc.contributor.kuprofilePhD Student
dc.contributor.kuprofileFaculty Member
dc.contributor.researchcenterKoç University Surface Science and Technology Center (KUYTAM) / Koç Üniversitesi Yüzey Teknolojileri Araştırmaları Merkezi (KUYTAM)
dc.contributor.researchcentern2STAR-Koç University Nanofabrication and Nanocharacterization Center for Scientifc and Technological Advanced Research
dc.contributor.schoolcollegeinstituteN/A
dc.contributor.schoolcollegeinstituteGraduate School of Sciences and Engineering
dc.contributor.schoolcollegeinstituteGraduate School of Sciences and Engineering
dc.contributor.schoolcollegeinstituteCollege of Engineering
dc.contributor.yokidN/A
dc.contributor.yokidN/A
dc.contributor.yokidN/A
dc.contributor.yokid115108
dc.date.accessioned2025-01-19T10:32:20Z
dc.date.issued2023
dc.description.abstractThe miniaturization of microelectromechanical systems (MEMS) physical sensors is driven by global connectivity needs and is closely linked to emerging digital technologies and the Internet of Things. Strong technical advantages of miniaturization such as improved sensitivity, functionality, and power consumption are accompanied by significant economic benefits due to semiconductor manufacturing. Hence, the trend to produce smaller sensors and their driving force resemble very much those of the miniaturization of integrated circuits (ICs) as described by Moore's law. In this respect, with its IC-, and MEMS-compatibility, and scalability, the silicon nanowire is frequently employed in frontier research as the sensor building block replacing conventional sensors. The integration of the silicon nanowire with MEMS has thus generated a multiscale hybrid architecture, where the silicon nanowire serves as the piezoresistive transducer and MEMS provide an interface with external forces, such as inertial or magnetic. This approach has been reported for almost all physical sensor types over the last decade. These sensors are reviewed here with detailed classification. In each case, associated technological challenges and comparisons with conventional counterparts are provided. Future directions and opportunities are highlighted.
dc.description.indexedbyWoS
dc.description.indexedbyScopus
dc.description.issue12
dc.description.openaccesshybrid
dc.description.publisherscopeInternational
dc.description.sponsoredbyTubitakEuTÜBİTAK
dc.description.sponsorsThis work was supported by TUEBITAK under grant numbers 120N361, 118C155, and 120E347.
dc.description.volume25
dc.identifier.doi10.1002/adem.202300007
dc.identifier.eissn1527-2648
dc.identifier.issn1438-1656
dc.identifier.quartileQ2
dc.identifier.scopus2-s2.0-85158118330
dc.identifier.urihttps://doi.org/10.1002/adem.202300007
dc.identifier.urihttps://hdl.handle.net/20.500.14288/26382
dc.identifier.wos982692300001
dc.keywordsDeep etch
dc.keywordsInertial sensors
dc.keywordsMicroelectromechanical systems
dc.keywordsNanoelectromechanical systems (MEMS
dc.keywordsNEMS)
dc.keywordsPiezoresistivity
dc.keywordsSingle-crystal reactive etching and metallization (SCREAM)
dc.keywordsSilicon nanowires
dc.keywordsThin silicon-on-insulator (SOI)
dc.languageen
dc.publisherWiley-V C H Verlag Gmbh
dc.relation.grantnoTUEBITAK [120N361, 118C155, 120E347]
dc.sourceAdvanced Engineering Materials
dc.subjectMaterials science
dc.titleSilicon nanowires driving miniaturization of microelectromechanical systems physical sensors: a review
dc.typeReview

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