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search.filters.author.Aygün, Uğur
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search.filters.subject.Scattering microscopy
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search.filters.subject.Optical reconstruction microscopy
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search.filters.subject.Science and technology
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2020
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search.filters.itemtype.Dissertation
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Depth scanning correlation interferometric microscopy for label-free nanoparticle detection
(
Koç University
,
2020
)
Aygün, Uğur
;
Ürey, Hakan
;
0000-0002-2031-7967
;
Koç University Graduate School of Sciences and Engineering
;
Electrical and Electronics Engineering
;
8579
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