Publication: Depth scanning correlation interferometric microscopy for label-free nanoparticle detection
Files
Program
Electrical and Electronics Engineering
KU-Authors
KU Authors
Co-Authors
Authors
Aygün, Uğur
Advisor
Ürey, Hakan
Publication Date
2020
Language
English
Type
Dissertation
Journal Title
Journal ISSN
Volume Title
Abstract
Description
xx, 110 leaves : illustrations ; 30 cm.
Source:
Publisher:
Koç University
Keywords:
Subject
Optical reconstruction microscopy, Scattering microscopy, Science and technology