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    Two-wavelength grating interferometry for extended range MEMS metrology
    (IEEE, 2007) N/A; N/A; Department of Electrical and Electronics Engineering; Toy, Muhammed Fatih; Ferhanoğlu, Onur; Ürey, Hakan; Master Student; PhD Student; Faculty Member; Department of Electrical and Electronics Engineering; Graduate School of Sciences and Engineering; Graduate School of Sciences and Engineering; College of Engineering; N/A; 205198; 8579
    Diffraction gratings integrated with MEMS has many applications as they can offer shot noise limited sub-nm displacement detection sensitivities but are limited in range. a two-wavelength readout method is developed that maintains high sensitivity while increasing the detection range from 105nm to 1.7um assuming sensitivity is maintained at > 50% of the maximum sensitivity.