Publication:
Torsional MEMS scanner design for high-resolution display systems

dc.contributor.departmentDepartment of Electrical and Electronics Engineering
dc.contributor.departmentDepartment of Electrical and Electronics Engineering
dc.contributor.kuauthorÜrey, Hakan
dc.contributor.kuprofileFaculty Member
dc.contributor.schoolcollegeinstituteCollege of Engineering
dc.contributor.yokid8579
dc.date.accessioned2024-11-09T13:11:30Z
dc.date.issued2002
dc.description.abstractIn scanning display systems, high horizontal and vertical resolution, and high refresh rate requirements translate into large mirror-size scan-angle product and high scanner-frequency requirements. A comparison between published scan-angle mirror-size product values for MEMS scanners and a Steel mechanical scanner is presented. Current performance levels of Steel mechanical scanners are better; however, Silicon MEMS scanners have good material properties and should be able to reach and exceed the performance levels of conventional mechanical scanners. The resolution limitations of mechanical and MEMS scanners are established using dynamic mirror deformation, flexure stress, and other oscillation mode frequencies. Analytical formulas for torsional, vertical deflection mode, lateral deflection mode, and rocking mode natural frequencies are derived using mechanical beam deflection theory.
dc.description.fulltextYES
dc.description.indexedbyWoS
dc.description.indexedbyScopus
dc.description.openaccessYES
dc.description.publisherscopeInternational
dc.description.sponsoredbyTubitakEuN/A
dc.description.sponsorshipN/A
dc.description.versionPublisher version
dc.formatpdf
dc.identifier.doi10.1117/12.469198
dc.identifier.eissn1996-756X
dc.identifier.embargoNO
dc.identifier.filenameinventorynoIR00695
dc.identifier.isbn0-8194-4540-1
dc.identifier.issn0277-786X
dc.identifier.linkhttps://doi.org/10.1117/12.469198
dc.identifier.quartileN/A
dc.identifier.scopus2-s2.0-0036421239
dc.identifier.urihttps://hdl.handle.net/20.500.14288/2862
dc.identifier.wos177782400003
dc.keywordsGrating interferometry
dc.keywordsDiffraction orders
dc.keywordsTwo-wavelength interferometry
dc.keywordsMEMS
dc.keywordsThermal imaging sensor array
dc.keywordsCCD camera
dc.languageEnglish
dc.publisherSociety of Photo-optical Instrumentation Engineers (SPIE)
dc.relation.urihttp://cdm21054.contentdm.oclc.org/cdm/ref/collection/IR/id/699
dc.sourceProceedings of SPIE
dc.subjectOptics
dc.titleTorsional MEMS scanner design for high-resolution display systems
dc.typeConference proceeding
dspace.entity.typePublication
local.contributor.authorid0000-0002-2031-7967
local.contributor.kuauthorÜrey, Hakan
relation.isOrgUnitOfPublication21598063-a7c5-420d-91ba-0cc9b2db0ea0
relation.isOrgUnitOfPublication.latestForDiscovery21598063-a7c5-420d-91ba-0cc9b2db0ea0

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