Publication: Understanding fundamental trade-offs in nanomechanical resonant sensors
dc.contributor.department | Department of Electrical and Electronics Engineering | |
dc.contributor.kuauthor | Demir, Alper | |
dc.contributor.schoolcollegeinstitute | College of Engineering | |
dc.date.accessioned | 2024-11-10T00:06:57Z | |
dc.date.issued | 2021 | |
dc.description.indexedby | WOS | |
dc.description.indexedby | Scopus | |
dc.description.issue | 15 | |
dc.description.openaccess | NO | |
dc.description.publisherscope | International | |
dc.description.sponsoredbyTubitakEu | N/A | |
dc.description.volume | 129 | |
dc.identifier.doi | 10.1063/5.0051601 | |
dc.identifier.eissn | 1089-7550 | |
dc.identifier.issn | 0021-8979 | |
dc.identifier.quartile | Q2 | |
dc.identifier.scopus | 2-s2.0-85104370888 | |
dc.identifier.uri | https://doi.org/10.1063/5.0051601 | |
dc.identifier.uri | https://hdl.handle.net/20.500.14288/16689 | |
dc.identifier.wos | 640620100001 | |
dc.keywords | Atomic force microscopy | |
dc.keywords | Commerce | |
dc.keywords | Economic and social effects | |
dc.keywords | Mass spectrometry | |
dc.keywords | Natural frequencies | |
dc.language.iso | eng | |
dc.publisher | Amer Inst Physics | |
dc.relation.ispartof | Journal of Applied Physics | |
dc.subject | Physics | |
dc.subject | Applied | |
dc.title | Understanding fundamental trade-offs in nanomechanical resonant sensors | |
dc.type | Journal Article | |
dspace.entity.type | Publication | |
local.contributor.kuauthor | Demir, Alper | |
local.publication.orgunit1 | College of Engineering | |
local.publication.orgunit2 | Department of Electrical and Electronics Engineering | |
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