A novel test coverage metric for concurrently-accessed software components (A work-in-progress paper)

Abstract

We propose a novel, practical coverage metric called "location pairs" (LP) for concurrently-accessed software components. The LP metric captures well common concurrency errors that lead to atomicity or refinement violations. We describe a software tool for measuring LP coverage and outline an inexpensive application of predicate abstraction and model checking for ruling out infeasible coverage targets.