Publication:
A novel test coverage metric for concurrently-accessed software components (A work-in-progress paper)

dc.contributor.coauthorN/A
dc.contributor.departmentDepartment of Computer Engineering
dc.contributor.departmentN/A
dc.contributor.departmentDepartment of Computer Engineering
dc.contributor.departmentDepartment of Computer Engineering
dc.contributor.kuauthorTaşıran, Serdar
dc.contributor.kuauthorElmas, Tayfun
dc.contributor.kuauthorBölükbaşı, Güven
dc.contributor.kuauthorKeremoğlu, M. Erkan
dc.contributor.kuprofileFaculty Member
dc.contributor.kuprofilePhD Student
dc.contributor.kuprofileUndergraduate Student
dc.contributor.kuprofileReseacher
dc.contributor.otherDepartment of Computer Engineering
dc.contributor.schoolcollegeinstituteCollege of Engineering
dc.contributor.schoolcollegeinstituteGraduate School of Sciences and Engineering
dc.contributor.schoolcollegeinstituteCollege of Engineering, College of Engineering
dc.contributor.yokidN/A
dc.contributor.yokidN/A
dc.contributor.yokidN/A
dc.contributor.yokidN/A
dc.date.accessioned2024-11-10T00:12:42Z
dc.date.issued2006
dc.description.abstractWe propose a novel, practical coverage metric called "location pairs" (LP) for concurrently-accessed software components. The LP metric captures well common concurrency errors that lead to atomicity or refinement violations. We describe a software tool for measuring LP coverage and outline an inexpensive application of predicate abstraction and model checking for ruling out infeasible coverage targets.
dc.description.indexedbyWoS
dc.description.indexedbyScopus
dc.description.openaccessNO
dc.description.volume3997
dc.identifier.doiN/A
dc.identifier.eissn1611-3349
dc.identifier.isbn3-540-34454-3
dc.identifier.issn0302-9743
dc.identifier.scopus2-s2.0-33746661639
dc.identifier.urihttps://hdl.handle.net/20.500.14288/17696
dc.identifier.wos238417600005
dc.keywordsN/A
dc.languageEnglish
dc.publisherSpringer-Verlag Berlin
dc.sourceFormal Approaches To Software Testing
dc.subjectComputer science
dc.subjectSoftware engineering
dc.titleA novel test coverage metric for concurrently-accessed software components (A work-in-progress paper)
dc.typeConference proceeding
dspace.entity.typePublication
local.contributor.authoridN/A
local.contributor.authoridN/A
local.contributor.authoridN/A
local.contributor.authoridN/A
local.contributor.kuauthorTaşıran, Serdar
local.contributor.kuauthorElmas, Tayfun
local.contributor.kuauthorBölükbaşı, Güven
local.contributor.kuauthorKeremoğlu, M. Erkan
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relation.isOrgUnitOfPublication.latestForDiscovery89352e43-bf09-4ef4-82f6-6f9d0174ebae

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