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A novel test coverage metric for concurrently-accessed software components (A work-in-progress paper)

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dc.contributor.coauthorN/A
dc.contributor.departmentDepartment of Computer Engineering
dc.contributor.departmentGraduate School of Sciences and Engineering
dc.contributor.kuauthorBölükbaşı, Güven
dc.contributor.kuauthorElmas, Tayfun
dc.contributor.kuauthorKeremoğlu, M. Erkan
dc.contributor.kuauthorTaşıran, Serdar
dc.contributor.schoolcollegeinstituteCollege of Engineering
dc.contributor.schoolcollegeinstituteGRADUATE SCHOOL OF SCIENCES AND ENGINEERING
dc.date.accessioned2024-11-10T00:12:42Z
dc.date.issued2006
dc.description.abstractWe propose a novel, practical coverage metric called "location pairs" (LP) for concurrently-accessed software components. The LP metric captures well common concurrency errors that lead to atomicity or refinement violations. We describe a software tool for measuring LP coverage and outline an inexpensive application of predicate abstraction and model checking for ruling out infeasible coverage targets.
dc.description.indexedbyWOS
dc.description.indexedbyScopus
dc.description.openaccessNO
dc.description.sponsoredbyTubitakEuN/A
dc.description.volume3997
dc.identifier.eissn1611-3349
dc.identifier.isbn3-540-34454-3
dc.identifier.issn0302-9743
dc.identifier.scopus2-s2.0-33746661639
dc.identifier.urihttps://hdl.handle.net/20.500.14288/17696
dc.identifier.wos238417600005
dc.language.isoeng
dc.publisherSpringer-Verlag Berlin
dc.relation.ispartofFormal Approaches To Software Testing
dc.subjectComputer science
dc.subjectSoftware engineering
dc.titleA novel test coverage metric for concurrently-accessed software components (A work-in-progress paper)
dc.typeConference Proceeding
dspace.entity.typePublication
local.contributor.kuauthorTaşıran, Serdar
local.contributor.kuauthorElmas, Tayfun
local.contributor.kuauthorBölükbaşı, Güven
local.contributor.kuauthorKeremoğlu, M. Erkan
local.publication.orgunit1College of Engineering
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