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Depth scanning correlation interferometric microscopy for label-free nanoparticle detection

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dc.contributor.advisorÜrey, Hakan
dc.contributor.advisorid0000-0002-2031-7967
dc.contributor.authorAygün, Uğur
dc.contributor.instituteKoç University Graduate School of Sciences and Engineering
dc.contributor.programElectrical and Electronics Engineering
dc.contributor.yokid8579
dc.date.accessioned2024-11-09T22:42:46Z
dc.date.issued2020
dc.descriptionxx, 110 leaves : illustrations ; 30 cm.
dc.identifier.urihttps://hdl.handle.net/20.500.14288/6035
dc.languageEnglish
dc.publisherKoç University
dc.relation.collectionKU Theses and Dissertations
dc.rightsrestrictedAccess
dc.rights.copyrightsnote© All Rights Reserved. Accessible to Koç University Affiliated Users Only!
dc.subjectOptical reconstruction microscopy
dc.subjectScattering microscopy
dc.subjectScience and technology
dc.thesis.degreeDoctoral Degree
dc.thesis.grantorİstanbul
dc.titleDepth scanning correlation interferometric microscopy for label-free nanoparticle detection
dc.typeDissertation
dspace.entity.typePublication
relation.isAdvisorOfThesis99202acc-f1df-4e28-89ea-da7d4b8ebae3
relation.isAdvisorOfThesis.latestForDiscovery99202acc-f1df-4e28-89ea-da7d4b8ebae3

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