<link rel="stylesheet" href="styles.f3b1fba60ec7970c.css">

Publication:
In vitro biocompatibility evaluation of Ti1.5ZrTa0.5Nb0.5Hf0.5 refractory high-entropy alloy film for orthopedic implants: microstructural, mechanical properties and corrosion behavior

Loading...
Thumbnail Image

School / College / Institute

Item type:Organizational Unit,
Item type:Organizational Unit,
Item type:Organizational Unit,

Program

Organization Authors

Co-Authors

N/A

Date

Language

Embargo Status

N/A

Journal Title

Journal ISSN

Volume Title

Alternative Title

Abstract

In the present research, a non-equimolar Ti1.5ZrTa0.5Nb0.5Hf0.5 RHEA film with a thickness of 1.025 µm was deposited on 316L, CoCrMo, and Ti6Al4V substrates by RF magnetron sputtering system. The microstructural characterizations showed that an amorphous and compact film with a continuous and cauliflower-like morphology was developed on the substrates. The hardness and elastic modulus of the deposited film, together with its adhesion, were determined by the nanoindentation. The RHEA-coated specimens exhibited much improved surface mechanical properties as compared with uncoated ones. The results of the scratch test demonstrated that the RHEA film provides high adhesion strength on the Ti6Al4V substrate compared to 316L and CoCrMo. Potentiodynamic polarization and electrochemical impedance spectroscopy (EIS) tests were carried out in phosphate buffer saline (BPS) solution at 37 ± 1 °C. In contrast to RHEA-coated 316L and CoCrMo specimens, RHEA-Ti6Al4V showed remarkable polarization resistance without any trace of pitting on its surface. According to the EIS measurement, the charge transfer resistance of the RHEA-Ti6Al4V specimen is significantly high, about 1.5 × 107 Ω cm2, owing to the strong bonding between the RHEA film and Ti6Al4V substrate.

Source

Publisher

Elsevier

Citation

item.page.haspartof

Source

Journal of Alloys and Compounds

item.page.ispartofseries

item.page.edition

DOI

10.1016/j.jallcom.2021.160786

item.page.datauri

item.page.link

Rights

N/A

Copyrights Note

Rights and licensing

N/A

Endorsement

Review

Supplemented By

Referenced By

Related Patent

Related Goal

Google Scholar
Scholar'da Ara ↗
2
Görüntülenme
0
İndirme
Altmetric
Dimensions
PlumX Metrikleri
BIP! Indicators