Publication: The design of mission-based component test plans for series connection of subsystems
Program
KU-Authors
KU Authors
Co-Authors
Altinel, I. Kuban
Cekyay, Bora
Feyzioglu, Orhan
Keskin, M. Emre
Publication Date
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Type
Embargo Status
Journal Title
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Volume Title
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Abstract
This article analyzes the mission-based component testing problem of devices which consist of series connection of 1-out-of-n subsystems or series connection of m-out-of-n subsystems. The device is designed to perform a mission that has a random sequence of phases with random durations. It is assumed that the deterioration of the components of the system is modulated by the mission process in such a way that the component failure rates depend on the phase that is performed. The objective is to find optimal component test times that yield desired levels of system reliability. An algorithmic procedure that is based on a column generation technique and d.c. programming is presented. This procedure eventually solves a semi-infinite linear program and it is illustrated by numerical examples. The existence of optimal component test times is discussed and sufficient conditions for the feasibility of the underlying semi-infinite linear programming model are determined.
Source
Publisher
Taylor and Francis Inc
Subject
Engineering, Industrial engineering, Operations research, Management science
Citation
Has Part
Source
IIE Transactions
Book Series Title
Edition
DOI
10.1080/0740817X.2012.733484