Publication:
The design of mission-based component test plans for series connection of subsystems

dc.contributor.coauthorAltinel, I. Kuban
dc.contributor.coauthorCekyay, Bora
dc.contributor.coauthorFeyzioglu, Orhan
dc.contributor.coauthorKeskin, M. Emre
dc.contributor.departmentDepartment of Industrial Engineering
dc.contributor.kuauthorÖzekici, Süleyman
dc.contributor.schoolcollegeinstituteCollege of Engineering
dc.date.accessioned2024-11-09T23:27:29Z
dc.date.issued2013
dc.description.abstractThis article analyzes the mission-based component testing problem of devices which consist of series connection of 1-out-of-n subsystems or series connection of m-out-of-n subsystems. The device is designed to perform a mission that has a random sequence of phases with random durations. It is assumed that the deterioration of the components of the system is modulated by the mission process in such a way that the component failure rates depend on the phase that is performed. The objective is to find optimal component test times that yield desired levels of system reliability. An algorithmic procedure that is based on a column generation technique and d.c. programming is presented. This procedure eventually solves a semi-infinite linear program and it is illustrated by numerical examples. The existence of optimal component test times is discussed and sufficient conditions for the feasibility of the underlying semi-infinite linear programming model are determined.
dc.description.indexedbyWOS
dc.description.indexedbyScopus
dc.description.issue11
dc.description.openaccessNO
dc.description.publisherscopeInternational
dc.description.sponsoredbyTubitakEuN/A
dc.description.sponsorshipTurkish Scientific and Technological Research Council (TUBITAK) [106M044] This research was supported by the Turkish Scientific and Technological Research Council (TUBITAK) wild Grant: 106M044.
dc.description.volume45
dc.identifier.doi10.1080/0740817X.2012.733484
dc.identifier.eissn1545-8830
dc.identifier.issn0740-817X
dc.identifier.quartileQ1
dc.identifier.scopus2-s2.0-84880256186
dc.identifier.urihttps://doi.org/10.1080/0740817X.2012.733484
dc.identifier.urihttps://hdl.handle.net/20.500.14288/11725
dc.identifier.wos321690500006
dc.keywordsComponent testing
dc.keywordsPhased-mission systems
dc.keywordsMission reliability
dc.keywordsSemi-infinite linear programming
dc.keywordsColumn generation
dc.keywordsSystem
dc.keywordsReliability
dc.language.isoeng
dc.publisherTaylor and Francis Inc
dc.relation.ispartofIIE Transactions
dc.subjectEngineering
dc.subjectIndustrial engineering
dc.subjectOperations research
dc.subjectManagement science
dc.titleThe design of mission-based component test plans for series connection of subsystems
dc.typeJournal Article
dspace.entity.typePublication
local.contributor.kuauthorÖzekici, Süleyman
local.publication.orgunit1College of Engineering
local.publication.orgunit2Department of Industrial Engineering
relation.isOrgUnitOfPublicationd6d00f52-d22d-4653-99e7-863efcd47b4a
relation.isOrgUnitOfPublication.latestForDiscoveryd6d00f52-d22d-4653-99e7-863efcd47b4a
relation.isParentOrgUnitOfPublication8e756b23-2d4a-4ce8-b1b3-62c794a8c164
relation.isParentOrgUnitOfPublication.latestForDiscovery8e756b23-2d4a-4ce8-b1b3-62c794a8c164

Files